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Publication years (Num. hits)
1990-1992 (23) 1993-1994 (28) 1995 (31) 1996 (29) 1997 (28) 1998 (36) 1999 (25) 2000 (35) 2001-2002 (44) 2003 (24) 2004-2005 (29) 2006-2007 (21) 2008-2010 (16) 2011-2019 (15) 2020-2023 (2)
Publication types (Num. hits)
article(116) inproceedings(270)
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Results
Found 386 publication records. Showing 386 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
157Srdjan Dragic, Martin Margala A 1.2V Built-In Architecture for High Frequency On-Line Iddq/delta Iddq Test. Search on Bibsonomy ISVLSI The full citation details ... 2002 DBLP  DOI  BibTeX  RDF Current Amplifier, On-Line Testing, Iddq, delta Iddq, Current Monitoring
143Chih-Wen Lu, Chauchin Su, Chung-Len Lee 0001, Jwu E. Chen Is IDDQ testing not applicable for deep submicron VLSI in year 2011? Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF deep submicron VLSI, IDDQ current estimation, random process deviations, IDDQ distributions, VLSI, statistical analysis, integrated circuit testing, CMOS integrated circuits, leakage currents, IDDQ testing, statistical approach, standard deviation, input vectors, circuit size
133Arabi Keshk, Kozo Kinoshita, Yukiya Miura IDDQ Current Dependency on Test Vectors and Bridging Resistance. Search on Bibsonomy Asian Test Symposium The full citation details ... 1999 DBLP  DOI  BibTeX  RDF Bridging fault, IDDQ Testing
128Jan Schat Evaluation of the Iddq Signature in devices with Gauss-distributed background current. Search on Bibsonomy DDECS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
128Yukio Okuda Eigen-Signatures for Regularity-based IDDQ Testing. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
126Yoshinobu Higami, Yuzo Takamatsu, Kewal K. Saluja, Kozo Kinoshita Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF IDDQ measurement vector, sequential circuit, bridging fault, IDDQ testing
116Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Defect Correlation, Principal Component Analysis, IDDQ, Binning, Test Optimization
114Masaru Sanada A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq. Search on Bibsonomy VTS The full citation details ... 1996 DBLP  DOI  BibTeX  RDF CAD-based failure diagnosis technology, CMOS LSI, abnormal Iddq phenomenon, physical damage detection, faulty blocks, failure point localization, Iddq test patterns, fault diagnosis, logic testing, integrated circuit testing, automatic testing, CMOS logic circuits, circuit CAD, large scale integration
109Chih-Wen Lu, Chung-Len Lee 0001, Chauchin Su, Jwu-E Chen Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing. Search on Bibsonomy J. Electron. Test. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF VLSI, IDDQ testing, deep sub-micron
102Paul Lee, Alfred Chen, Dilip Mathew A Speed-Dependent Approach for Delta IDDQ Implementation. Search on Bibsonomy DFT The full citation details ... 2001 DBLP  DOI  BibTeX  RDF Self-scaling IDDQ, Speed Performance Index, characterization, Delta IDDQ
102Yann Antonioli, Tsuneo Inufushi, Shigeki Nishikawa, Kozo Kinoshita A high-speed IDDQ sensor implementation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF circuit feedback, high-speed IDDQ sensor implementation, submicron CMOS process, feedback scheme, floppy-disk controller IDDQ test, current sensor, built-in sensor, 0.35 micron, 50 MHz, integrated circuit testing, CMOS digital integrated circuits, BICS, electric current measurement, electric sensing devices
102B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. Search on Bibsonomy DATE The full citation details ... 1998 DBLP  DOI  BibTeX  RDF IDDQ monitors, test hardware, CMOS, testability, integrated circuits, IDDQ
98Claude Thibeault On the Comparison of IDDQ and IDDQ Testing. Search on Bibsonomy VTS The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
92Chintan Patel, Abhishek Singh 0001, Jim Plusquellic Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
92Yukio Okuda, Nobuyuki Furukawa Hysteresis of Intrinsic IDDQ Currents. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
92C. P. Ravikumar, Rahul Kumar Divide-and-Conquer IDDQ Testing for Core-Based System Chips. Search on Bibsonomy ASP-DAC/VLSI Design The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
92Lan Zhao, D. M. H. Walker, Fabrizio Lombardi IDDQ Testing of Bridging Faults in Logic Resources of Reconfigurable Field Programmable Gate Arrays. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
92Jerry M. Soden, Charles F. Hawkins IDDQ Testing: Issues Present and Future. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 1996 DBLP  DOI  BibTeX  RDF
90Chintan Patel, Abhishek Singh 0001, Jim Plusquellic Defect Detection Using Quiescent Signal Analysis. Search on Bibsonomy J. Electron. Test. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing
90Lan Zhao, D. M. H. Walker, Fabrizio Lombardi Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF IDDQ Tes t, Configurable Logic Blocks, FPGA, Testing, Bridging Fault, Programming Phase
86Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita IDDQ Sensing Technique for High Speed IDDQ Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
85Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell CMOS IC reliability indicators and burn-in economics. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
85Toshiyuki Maeda, Kozo Kinoshita Compaction of IDDQ Test Sequence Using Reassignment Method. Search on Bibsonomy J. Electron. Test. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF reassignment method, weighted random vector, sequential circuit, IDDQ testing, test compaction
85Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 1999 DBLP  DOI  BibTeX  RDF IDDQ testing, test compaction
85Rosa Rodríguez-Montañés, Joan Figueras Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. Search on Bibsonomy DATE The full citation details ... 1998 DBLP  DOI  BibTeX  RDF IDDQ testability, CMOS, deep-submicron
85Peter C. Maxwell The use of IDDQ testing in low stuck-at coverage situations. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF stuck-at coverage situations, quality goal, graded coverage, composite metric, fault diagnosis, logic testing, logic tests, integrated circuit testing, automatic testing, application specific integrated circuits, ASIC, CMOS logic circuits, IDDQ testing, IC testing
80Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy 0001 Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
80Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. Search on Bibsonomy VLSI Design The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
80Shengli Li, Kai Zhang, Jien-Chung Lo The 2nd Order Analysis of IDDQ Test Data. Search on Bibsonomy DFT The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
80R. D. (Shawn) Blanton IDDQ-Testability of Tree Circuits. Search on Bibsonomy VLSI Design The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
77Sagar S. Sabade, D. M. H. Walker Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification. Search on Bibsonomy VLSI Design The full citation details ... 2003 DBLP  DOI  BibTeX  RDF spatial correlation, IDDQ testing, delta IDDQ
77Hisashi Kondo, Kwang-Ting Cheng Driving toward higher IDDQ test quality for sequential circuits: a generalized fault model and its ATPG. Search on Bibsonomy ICCAD The full citation details ... 1996 DBLP  DOI  BibTeX  RDF Selective IDDQ, Pseudo Stuck-at Fault, Sequential ATPG, Vector compaction, Test, Fault model, IDDQ, Leakage Fault
67B. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
67Chuen-Song Chen, Jien-Chung Lo, Tian Xia Equivalent IDDQ Tests for Systems with Regulated Power Supply. Search on Bibsonomy DFT The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
67Abhijit Prasad, D. M. H. Walker Chip Level Power Supply Partitioning for IDDQ Testing Using Built-In Current Sensors. Search on Bibsonomy DFT The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
67Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota Test Vector Generation Based on Correlation Model for Ratio-Iddq. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
67Swarup Bhunia, Hai Li, Kaushik Roy 0001 A High Performance IDDQ Testable Cache for Scaled CMOS Technologies. Search on Bibsonomy Asian Test Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
67Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos, Angela Arapoyanni Extending the Viability of IDDQ Testing in the Deep Submicron Era. Search on Bibsonomy ISQED The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
67Sagar S. Sabade, D. M. H. Walker Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
67Bram Kruseman, Stefan van den Oetelaar, Josep Rius 0001 Comparison of IDDQ Testing and Very-Low Voltage Testing. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
67Zhanping Chen, Liqiong Wei, Kaushik Roy 0001 On effective IDDQ testing of low-voltage CMOS circuits using leakage control techniques. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
67Chintan Patel, Jim Plusquellic A Process and Technology-Tolerant IDDQ Method for IC Diagnosis. Search on Bibsonomy VTS The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
67Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda Testability Analysis of IDDQ Testing with Large Threshold Value. Search on Bibsonomy DFT The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
67Zhanping Chen, Liqiong Wei, Kaushik Roy 0001 On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques. Search on Bibsonomy ISQED The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
65Hisashi Kondo, Kwang-Ting Cheng An Efficient Compact Test Generator for IDDQ Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 1996 DBLP  DOI  BibTeX  RDF Selective IDDQ, Pattern Compaction, Pseudo Stuck-at Fault, Essential Fault, Test, ATPG, Fault Model, Testability, IDDQ, Leakage Fault
60Jim Plusquellic, Dhruva Acharyya, Abhishek Singh 0001, Mohammad Tehranipoor, Chintan Patel Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Quiescent Signal Analysis, defect detection, IDDQ
60Chuen-Song Chen, Jien-Chung Lo, Tian Xia An indirect current sensing technique for IDDQ and IDDT tests. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2006 DBLP  DOI  BibTeX  RDF IDDT, IDDQ, current testing, BICS
60Y. Tsiatouhas, Th. Haniotakis, Angela Arapoyanni An Embedded IDDQ Testing Architecture and Technique. Search on Bibsonomy ISQED The full citation details ... 2003 DBLP  DOI  BibTeX  RDF IEEE 1149.1, Design for Testability (DFT), Boundary Scan, IDDQ Testing
60Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos A Compact Built-In Current Sensor for IDDQ Testing. Search on Bibsonomy IOLTW The full citation details ... 2000 DBLP  DOI  BibTeX  RDF Bridging and Stuck-on fault testability, Design for testability, DFT, IDDQ testing, Built in current sensors, BICS, Current monitoring
60Hugo Cheung, Sandeep K. Gupta 0001 A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF critical severity, test escape, fault modeling, IDDQ, yield loss
60Theo J. Powell, James R. Pair, Melissa St. John, Doug Counce Delta Iddq for Testing Reliability. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF reliability, Iddq
60Víctor H. Champac, José Castillejos, Joan Figueras IDDQ Testing of Opens in CMOS SRAMs. Search on Bibsonomy J. Electron. Test. The full citation details ... 1999 DBLP  DOI  BibTeX  RDF data retention faults, memory testing, opens, IDDQ
60Yinghua Min, Zhongcheng Li IDDT Testing versus IDDQ Testing. Search on Bibsonomy J. Electron. Test. The full citation details ... 1998 DBLP  DOI  BibTeX  RDF IDDT test, IDDQ test, stuck-open fault, Boolean process
55Bin Xue, D. M. H. Walker Is IDDQ Test of Microprocessors Feasible? Search on Bibsonomy MTV The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
55Sagar S. Sabade, D. M. H. Walker Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests. Search on Bibsonomy VLSI Design The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
55Masaki Hashizume, Teppei Takeda, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, Kozo Kinoshita A BIST Circuit for IDDQ Tests. Search on Bibsonomy Asian Test Symposium The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
55Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
55Sagar S. Sabade, D. M. H. Walker IDDQ Test: Will It Survive the DSM Challenge? Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55Sagar S. Sabade, D. M. H. Walker Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis. Search on Bibsonomy DFT The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55Claude Thibeault Speeding-Up IDDQ Measurements. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55W. Robert Daasch, Kevin Cota, James McNames, Robert Madge Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55David I. Bergman, Hans Engler Improved IDDQ Testing with Empirical Linear Prediction. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55Sagar S. Sabade, D. M. H. Walker Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting. Search on Bibsonomy ASP-DAC/VLSI Design The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55Juan M. Díez, Juan Carlos López 0001 Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion. Search on Bibsonomy DATE The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
55Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
55Yoshinobu Higami, Kewal K. Saluja, Kozo Kinoshita Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
55Manoj Sachdev Deep sub-micron IDDQ testing: issues and solutions. Search on Bibsonomy ED&TC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
49Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
48Sagar S. Sabade, D. M. H. Walker Use of Multiple IDDQ Test Metrics for Outlier Identification. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF Current ratio, neighbor current ratio, outlier identification, spatial correlation, IDDQ testing
48Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda High speed IDDQ test and its testability for process variation. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF high speed IDDQ test, charge current, gate load capacitances, test input vector application, CMOS IC production, logic testing, integrated circuit testing, process variation, testability, CMOS logic circuits, production testing
48Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi Cyclic greedy generation method for limited number of IDDQ tests. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF cyclic greedy generation method, undetected faults, ISCAS85Y circuits, short circuit faults, fault diagnosis, integrated circuit testing, iterative methods, iterative method, CMOS integrated circuits, IDDQ tests, test patterns, CMOS IC, electric current measurement, cyclic, random patterns
48Claude Thibeault Efficient Diagnosis of Single/Double Bridging Faults with Delta Iddq Probabilistic Signatures and Viterbi Algorithm. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF probabilistic signatures, double faults, Diagnosis, Viterbi algorithm, Delta Iddq
48Yoshinobu Higami, Yuzo Takamatsu, Kewal K. Saluja, Kozo Kinoshita Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 1999 DBLP  DOI  BibTeX  RDF sequential circuit, fault simulation, bridging fault, IDDQ testing
48Tsuyoshi Shinogi, Terumine Hayashi A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 1999 DBLP  DOI  BibTeX  RDF compact test generation, parallel processing, ATPG, IDDQ testing
48Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. Search on Bibsonomy VTS The full citation details ... 1997 DBLP  DOI  BibTeX  RDF semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing
48Hari Balachandran, D. M. H. Walker Improvement of SRAM-based failure analysis using calibrated Iddq testing. Search on Bibsonomy VTS The full citation details ... 1996 DBLP  DOI  BibTeX  RDF defect-bitmap dictionary, voltage testing, microprocessor cache memory, integrated circuit testing, calibration, calibration, SRAM, cache storage, failure analysis, failure analysis, IDDQ testing, current testing, defect classification, SRAM chips, integrated circuit yield, integrated circuit yield
48Jason P. Hurst, Adit D. Singh A differential built-in current sensor design for high speed IDDQ testing. Search on Bibsonomy VLSI Design The full citation details ... 1995 DBLP  DOI  BibTeX  RDF built-in current sensor design, high speed IDDQ testing, differential architecture, quiescent current detection, BIST environment, n-well technology, MOSIS, 31.25 MHz, VLSI, built-in self test, built-in self-test, integrated circuit testing, design for testability, integrated circuit design, CMOS digital integrated circuits, electric current measurement, 2 micron, electric sensing devices
43Junichi Hirase, Yoshiyuki Goi, Yoshiyuki Tanaka IDDQ Testing Method using a Scan Pattern for Production Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
43Thomas J. Vogels Effectiveness of I-V Testing in Comparison to IDDq Tests. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
43Nobuhiro Sato, Yoshihiro Hashimoto A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
43Sreejit Chakravarty, Sujit T. Zachariah STBM: a fast algorithm to simulate IDDQ tests forleakage faults. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
43Lan Zhao, D. M. H. Walker, Fabrizio Lombardi Bridging Fault Detection in FPGA Interconnects Using IDDQ. Search on Bibsonomy FPGA The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
43M. Svajda, B. Straka, Hans A. R. Manhaeve IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. Search on Bibsonomy DATE The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
43Md. Altaf-Ul-Amin, Zahari Mohamed Darus An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
43B. Laquai, H. Richter, H. Werkmann A production-oriented measurement method for fast and exhaustive Iddq tests. Search on Bibsonomy ED&TC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
43Don Douglas Josephson, Mark Storey, Daniel D. Dixon Microprocessor IDDQ Testing: A Case Study. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 1995 DBLP  DOI  BibTeX  RDF
43S. Wayne Bollinger, Scott F. Midkiff Test generation for IDDQ testing of bridging faults in CMOS circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
41Swaroop Ghosh, Swarup Bhunia, Kaushik Roy 0001 Low-Power and testable circuit synthesis using Shannon decomposition. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Shannon expansion, dynamic supply gating, test coverage, Design-for-test, IDDQ, noise immunity, test power
41Anton Chichkov, Dirk Merlier, Peter Cox Current Testing Procedure for Deep Submicron Devices. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF ASIC testing, IDDQ, deep submicron
41Antonio Zenteno, Víctor H. Champac, Joan Figueras Detectability Conditions of Full Opens in the Interconnections. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF logic testing, IDDQ testing, opens, defect modeling
41Yukiya Miura, Hiroshi Yamazaki A Low-Loss Built-In Current Sensor. Search on Bibsonomy J. Electron. Test. The full citation details ... 1999 DBLP  DOI  BibTeX  RDF low-voltage LSIs, multiple power supplies, IDDQ testing, Built-in current sensor
41Claude Thibeault Increasing Current Testing Resolution. Search on Bibsonomy DFT The full citation details ... 1998 DBLP  DOI  BibTeX  RDF current signatures, test, Integrated circuits, Iddq testing
41Yinghua Min, Zhuxing Zhao, Zhongcheng Li IDDT Testing. Search on Bibsonomy Asian Test Symposium The full citation details ... 1997 DBLP  DOI  BibTeX  RDF IDDT test, IDDQ test, stuck-open fault, Boolean process
38Alexei Kaltchenko, Oleg Semenov Temperature dependence of IDDQ distribution: application for thermal delta IDDQ testing. Search on Bibsonomy IET Circuits Devices Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
38Carlo Dallavalle Adaptive IDDQ: How to Set an IDDQ Limit for any Device Under Test. Search on Bibsonomy IOLTW The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
36Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch Defect Screening Using Independent Component Analysis on I_DDQ. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
36Ali Keshavarzi, Kaushik Roy 0001, Charles F. Hawkins Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
36Wanli Jiang, Bapiraju Vinnakota IC test using the energy consumption ratio. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
36Josep Rius 0001, Luis Elvira Villagra, Maurice Meijer A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. Search on Bibsonomy ETS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF IDDQ testing
36Toshiyuki Maeda, Kozo Kinoshita Memory reduction of IDDQ test compaction for internal and external bridging faults. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF I/sub DDQ/ test compaction, internal bridging faults, external bridging faults, IDDQ test sequence, reassignment method, weighted random sequences, logic testing, integrated circuit testing, sequential circuits, sequential circuits, automatic testing, fault simulation, CMOS logic circuits, CMOS circuits, test application time reduction, memory reduction
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