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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 838 occurrences of 477 keywords
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Results
Found 1066 publication records. Showing 1066 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
69 | Ghassan Al Hayek, Chantal Robach |
On the Adequacy of Deriving Hardware Test Data from the Behavioral Specification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 22rd EUROMICRO Conference '96, Beyond 2000: Hardware and Software Design Strategies, September 2-5, 1996, Prague, Czech Republic, pp. 337-342, 1996, IEEE Computer Society, 0-8186-7487-3. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
hardware test data, behavioral fault modeling, gate-level strategies, high-level fault detection, gate-level fault detection, design automation tools, generated test set, gate-level fault coverage, hardware description languages, hardware description languages, behavioral specification |
59 | Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami |
GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA, pp. 73-80, 2000, IEEE Computer Society, 0-7695-0525-2. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Hot Carrier Effect, Gate level modeling, Gate level simulation, Circuit reliability simulation, VLSI |
55 | Scott Davidson 0001 |
High level design automation tools (session overview). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Conference on Computer Science ![In: Proceedings of the 13th ACM Annual Conference on Computer Science, New Orleans, Louisiana, USA, 1985, pp. 73, 1985, ACM, 0-89791-150-4. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP DOI BibTeX RDF |
|
49 | Sheng Wei 0001, Saro Meguerdichian, Miodrag Potkonjak |
Gate-level characterization: foundations and hardware security applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010, pp. 222-227, 2010, ACM, 978-1-4503-0002-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
gate-level characterization, hardware Trojan horse, thermal conditioning, manufacturing variability |
48 | Irith Pomeranz, Sudhakar M. Reddy |
Functional test generation for delay faults in combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1995, San Jose, California, USA, November 5-9, 1995, pp. 687-694, 1995, IEEE Computer Society / ACM, 0-8186-7213-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
gate-level realizations, logic testing, delays, test generation, test generators, combinational circuits, fault simulated, logic CAD, delay faults, functional fault model, functional test generation |
47 | Man-Lap Li, Pradeep Ramachandran, Ulya R. Karpuzcu, Siva Kumar Sastry Hari, Sarita V. Adve |
Accurate microarchitecture-level fault modeling for studying hardware faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCA ![In: 15th International Conference on High-Performance Computer Architecture (HPCA-15 2009), 14-18 February 2009, Raleigh, North Carolina, USA, pp. 105-116, 2009, IEEE Computer Society, 978-1-4244-2932-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
46 | Debapriya Chatterjee, Andrew DeOrio, Valeria Bertacco |
Event-driven gate-level simulation with GP-GPUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009, pp. 557-562, 2009, ACM, 978-1-60558-497-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
gate-level simulation, general purpose graphics processing unit (GP-GPU), high-performance simulation |
44 | Chris J. Myers, Tomas Rokicki, Teresa H.-Y. Meng |
Automatic synthesis of gate-level timed circuits with choice. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARVLSI ![In: 16th Conference on Advanced Research in VLSI (ARVLSI '95), March 27-29, 1995, Chapel Hill, North Carolina, USA, pp. 42-58, 1995, IEEE Computer Society, 0-8186-7047-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
gate-level timed circuits, C-elements, explicit timing information, textual specification, conditional operation, reachable state space, semi-custom components, timing, logic CAD, asynchronous circuits, asynchronous circuits, circuit CAD, cellular arrays, circuit complexity, logic arrays, graphical representation, standard-cells, CAD tool, automatic synthesis, gate-arrays, state-space methods, AND gates, OR gates |
43 | Shahrzad Mirkhani, Meisam Lavasani, Zainalabedin Navabi |
Hierarchical Fault Simulation Using Behavioral and Gate Level Hardware Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, pp. 374-, 2002, IEEE Computer Society, 0-7695-1825-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
43 | Mark Litterick, Joachim Geishauser |
Robust Vera Coding Techniques for Gate-Level and Tester-Compliant SoC Verification Environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTV ![In: Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), Common Challenges and Solutions, 08-10 September 2004, Austin, Texas, USA, pp. 64-78, 2004, IEEE Computer Society, 0-7695-2320-X. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
41 | Mu-Shun Matt Lee, Chin-Hsun Lin, Chien-Nan Jimmy Liu, Shih-Che Lin |
Quick supply current waveform estimation at gate level using existed cell library information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008, pp. 135-138, 2008, ACM, 978-1-59593-999-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
current waveform estimation, gate-level |
40 | Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck |
Deterministic test generation for non-classical faults on the gate level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 244-251, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
deterministic test pattern generator, gate level fault models, function conversions, nonclassical faults, fault list generator, library-based fault modeling strategy, ISCAS benchmark circuits, scan-based circuits, CMOS cell library, algorithm, fault diagnosis, logic testing, design for testability, ATPG, combinational circuits, combinational circuits, fault simulator, logic CAD, stuck-at faults, CMOS logic circuits, bridging faults, deterministic algorithms, logic simulation, transition faults, automatic test software, test efficiency, CONTEST |
40 | Scott Woods, Giorgio Casinovi |
Gate-level simulation of digital circuits using multi-valued Boolean algebras. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1995, San Jose, California, USA, November 5-9, 1995, pp. 413-419, 1995, IEEE Computer Society / ACM, 0-8186-7213-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
Gate-level logic simulation, mixed-mode simulation, boolean equations solution, multi-valued logic |
39 | Ashish Srivastava, Kaviraj Chopra, Saumil Shah, Dennis Sylvester, David T. Blaauw |
A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2), pp. 272-285, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
38 | Bao Liu 0001 |
Gate Level Statistical Simulation Based on Parameterized Models for Process and Signal Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 257-262, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
37 | Alexander Maili, Damian Dalton, Christian Steger |
A Generic Timing Mechanism for Using the APPLES Gate-Level Simulator in a Mixed-Level Simulation Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PATMOS ![In: Integrated Circuit and System Design, Power and Timing Modeling, Optimization and Simulation; 14th International Workshop, PATMOS 2004, Santorini, Greece, September 15-17, 2004, Proceedings, pp. 799-808, 2004, Springer, 3-540-23095-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
36 | Srivaths Ravi 0001, Niraj K. Jha, Indradeep Ghosh, Vamsi Boppana |
A Technique for Identifying RTL and Gate-Level Correspondences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, ICCD '00, Austin, Texas, USA, September 17-20, 2000, pp. 591-594, 2000, IEEE Computer Society, 0-7695-0801-4. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
35 | Foong-Charn Chang, Chin-Fu Chen, Prasad Subramaniam |
An Accurate and Efficient Gate Level Delay Calculator for MOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 25th ACM/IEEE Conference on Design Automation, DAC '88, Anaheim, CA, USA, June 12-15, 1988., pp. 282-287, 1988, ACM. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP BibTeX RDF |
|
35 | Teruhiko Yamada, Koji Yamazaki, Edward J. McCluskey |
A simple technique for locating gate-level faults in combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 65-70, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electron probe analysis, optical microscopy, gate-level faults, error sources, fault deduction, fault elimination, ISCAS'85 benchmark circuits, physical defect analysis, electron beam probing, light emission microscopy, computational complexity, VLSI, VLSI, fault diagnosis, logic testing, integrated circuit testing, combinational circuits, combinational circuits, digital simulation, circuit analysis computing, computation time, scanning electron microscopy, scanning electron microscopy, diagnostic resolution |
33 | Venkataraman Mahalingam, N. Ranganathan |
A Nonlinear Programming Based Power Optimization Methodology for Gate Sizing and Voltage Selection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), New Frontiers in VLSI Design, 11-12 May 2005, Tampa, FL, USA, pp. 180-185, 2005, IEEE Computer Society, 0-7695-2365-X. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Loganathan Lingappan, Srivaths Ravi 0001, Niraj K. Jha |
Satisfiability-based test generation for nonseparable RTL controller-datapath circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3), pp. 544-557, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
31 | Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto |
Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 51(2), pp. 200-215, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Testing of embedded systems, VHDL, ATPG, fault modeling, testability analysis |
31 | Irith Pomeranz, Sudhakar M. Reddy |
Functional test generation for delay faults in combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 3(2), pp. 231-248, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
function-robust tests, functional delay fault model, delay faults, path delay faults, robust tests |
31 | MyeongGyu Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada |
Moebius circuit: dual-rail dynamic logic for logic gate level pipeline with error gate search feature. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 177-180, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
dcvsl, high speed digital, pipeline, error detect, soft error |
31 | Chetana Nagendra, Robert Michael Owens, Mary Jane Irwin |
Design tradeoffs in high speed multipliers and FIR filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India, pp. 29-32, 1996, IEEE Computer Society, 0-8186-7228-5. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
high speed multipliers, high speed FIR filters, modified Booth recoding, pipeline granularity, transistor count, activity factor reduction, guarded evaluation, gate-level pipelining, half-bit level pipelining, bit-level pipelining, delay, clocking, digital filters, FIR filters, multiplying circuits, power dissipation, design tradeoffs, pipeline arithmetic, operation speed |
31 | Michael S. Hsiao, Janak H. Patel |
A new architectural-level fault simulation using propagation prediction of grouped fault-effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 628-635, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
architectural-level fault simulation, propagation prediction, grouped fault-effects, fault effects, intelligent propagation prediction, automated behavioral simulation, ALFSIM, Architectural Level Fault Simulation, gate level fault simulation, VLSI, fault diagnosis, circuit analysis computing, stuck at faults, integrated circuit design, deterministic algorithm, data types, symbolic data, architectural level |
31 | B. P. Harish, Navakanta Bhat, Mahesh B. Patil |
On a Generalized Framework for Modeling the Effects of Process Variations on Circuit Delay Performance Using Response Surface Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(3), pp. 606-614, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Jayashree Sridharan, Tom Chen 0001 |
Modeling multiple input switching of CMOS gates in DSM technology using HDMR. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 626-631, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
31 | Ashok K. Murugavel, N. Ranganathan |
Gate Sizing and Buffer Insertion using Economic Models for Power Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 195-200, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
30 | Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud |
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 266-271, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
30 | Raimund Ubar, Jaan Raik, Eero Ivask, Marina Brik |
Multi-Level Fault Simulation of Digital Systems on Decision Diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 86-91, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
register transfer and gate level descriptions, fault simulation, decision diagrams, Digital systems |
30 | Indradeep Ghosh, Anand Raghunathan, Niraj K. Jha |
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 173-179, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
design for hierarchical testability, gate-level sequential test generation, controller data path circuits, large data path bit-widths, minimal test hardware, system-level test set, logic testing, high level synthesis, high level synthesis, integrated circuit testing, design for testability, design for testability, automatic testing, logic CAD, integrated circuit design, behavioral synthesis, logic gates, register-transfer level design, RTL circuits |
30 | Chingwei Yeh, Yin-Shuin Kang |
Cell-based layout techniques supporting gate-level voltage scaling for low power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 9(6), pp. 983-986, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
30 | Chingwei Yeh, Yin-Shuin Kang |
Cell-based layout techniques supporting gate-level voltage scaling for low power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 8(5), pp. 629-633, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
29 | Miodrag Potkonjak, Ani Nahapetian, Michael Nelson 0002, Tammara Massey |
Hardware Trojan horse detection using gate-level characterization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009, pp. 688-693, 2009, ACM, 978-1-60558-497-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Hardware Trojan horses, gate-level characterization, linear programming, manufacturing variability |
29 | Saeeid Tahmasbi Oskuii, Per Gunnar Kjeldsberg, Einar J. Aas |
Probabilistic gate-level power estimation using a novel waveform set method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007, pp. 37-42, 2007, ACM, 978-1-59593-605-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
probabilistic power estimation, probability waveform, transition density, combinational logic, gate-level |
29 | Chunhong Chen, Majid Sarrafzadeh |
An Effective Algorithm for Gate-Level Power-Delay Tradeoff Using Two Voltages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings of the IEEE International Conference On Computer Design, VLSI in Computers and Processors, ICCD '99, Austin, Texas, USA, October 10-13, 1999, pp. 222-, 1999, IEEE Computer Society, 0-7695-0406-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Two-voltage, Algorithm, Low power, Gate-level |
29 | Oriol Roig, Jordi Cortadella, Enric Pastor |
Hierarchical gate-level verification of speed-independent circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASYNC ![In: Second Working Conference on Asynchronous Design Methodologies, May 30-31, 1995, London, England, UK, pp. 128-137, 1995, IEEE Computer Society, 0-8186-7098-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
hierarchical gate-level verification, state signals, computational complexity, logic testing, time complexity, asynchronous circuits, speed-independent circuits, complex gates |
29 | Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda |
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 1998 Design, Automation and Test in Europe (DATE '98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France, pp. 570-576, 1998, IEEE Computer Society, 0-8186-8359-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
software testing, sequential circuits, automatic test generation, test sequence compaction |
29 | Loganathan Lingappan, Srivaths Ravi 0001, Niraj K. Jha |
Test Generation for Non-separable RTL Controller-datapath Circuits using a Satisfiability based Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings, pp. 187-193, 2003, IEEE Computer Society, 0-7695-2025-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
29 | Ruofan Xu, Michael S. Hsiao |
Embedded core testing using genetic algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 254-259, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
gate level implementation, user defined logic, random inputs, high level benchmarks, wrapper size, genetic algorithms, genetic algorithms, fault diagnosis, logic testing, controllability, controllability, high level synthesis, automatic test pattern generation, observability, observability, application specific integrated circuits, fault coverage, SOC, test application time, test patterns, embedded core testing, internal state |
29 | Mitrajit Chatterjee, Dhiraj K. Pradhan, Wolfgang Kunz |
LOT: logic optimization with testability-new transformations using recursive learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1995, San Jose, California, USA, November 5-9, 1995, pp. 318-325, 1995, IEEE Computer Society / ACM, 0-8186-7213-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
EX-OR gates, logic optimization with testability, multi-level logic circuits, tstfx, logic design, combinational circuits, logic CAD, gate level, random-pattern testability, recursive learning |
29 | Alexander Maili, Christian Steger, Reinhold Weiss, Rob Quigley, Damian Dalton |
Reducing the Communication Bottleneck via On-Chip Cosimulation of Gate-Level HDL and C-Models on a Hardware Accelerator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), New Frontiers in VLSI Design, 11-12 May 2005, Tampa, FL, USA, pp. 290-291, 2005, IEEE Computer Society, 0-7695-2365-X. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
29 | Ying-Tsai Chang, Kwang-Ting Cheng |
Self-referential verification for gate-level implementations of arithmetic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(7), pp. 1102-1112, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | Anand Raghunathan, Sujit Dey, Niraj K. Jha |
Register-transfer level estimation techniques for switching activity and power consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1996, San Jose, CA, USA, November 10-14, 1996, pp. 158-165, 1996, IEEE Computer Society / ACM, 0-8186-7597-7. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
gate-level implementation, register-transfer level estimation, logic design, power consumption, switching activity, glitching, RTL designs |
28 | Zbysek Gajda, Lukás Sekanina |
Reducing the number of transistors in digital circuits using gate-level evolutionary design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GECCO ![In: Genetic and Evolutionary Computation Conference, GECCO 2007, Proceedings, London, England, UK, July 7-11, 2007, pp. 245-252, 2007, ACM, 978-1-59593-697-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
digital circuits, evolvable hardware, evolutionary design |
28 | Lukás Sekanina, Zdenek Vasícek |
On the Practical Limits of the Evolutionary Digital Filter Design at the Gate Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EvoWorkshops ![In: Applications of Evolutionary Computing, EvoWorkshops 2006: EvoBIO, EvoCOMNET, EvoHOT, EvoIASP, EvoINTERACTION, EvoMUSART, and EvoSTOC, Budapest, Hungary, April 10-12, 2006, Proceedings, pp. 344-355, 2006, Springer, 3-540-33237-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | Bernard N. Sheehan |
Library Compatible Ceff for Gate-Level Timing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France, pp. 826-830, 2002, IEEE Computer Society, 0-7695-1471-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
28 | Ying-Tsai Chang, Kwang-Ting Cheng |
Self-referential verification of gate-level implementations of arithmetic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002, pp. 311-316, 2002, ACM, 1-58113-461-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
arithmetic circuit verification |
28 | Chris J. Myers, Tomas Rokicki, Teresa H.-Y. Meng |
POSET timing and its application to the synthesis and verification of gate-level timed circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(6), pp. 769-786, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
27 | Jayashree Sridharan, Tom Chen 0001 |
Gate Delay Modeling with Multiple Input Switching for Static (Statistical) Timing Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India, pp. 323-328, 2006, IEEE Computer Society, 0-7695-2502-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
27 | Sandip Kundu |
GateMaker: a transistor to gate level model extractor for simulation, automatic test pattern generation and verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 372-381, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
27 | Tatjana Serdar, Carl Sechen |
AKORD: transistor level and mixed transistor/gate level placement tool for digital data paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999, San Jose, California, USA, November 7-11, 1999, pp. 91-97, 1999, IEEE Computer Society, 0-7803-5832-5. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
27 | Mohit Tiwari, Xun Li 0001, Hassan M. G. Wassel, Frederic T. Chong, Timothy Sherwood |
Execution leases: a hardware-supported mechanism for enforcing strong non-interference. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: 42st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-42 2009), December 12-16, 2009, New York, New York, USA, pp. 493-504, 2009, ACM, 978-1-60558-798-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
gate level information flow tracking, covert channels, high assurance systems, timing channels |
26 | Supratik Chakraborty, Rajeev Murgai |
Complexity Of Minimum-Delay Gate Resizing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India, pp. 425-430, 2001, IEEE Computer Society, 0-7695-0831-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
26 | Susmita Sur-Kolay, Marly Roncken, Ken S. Stevens, Parimal Pal Chaudhuri, Rob Roy |
Fsimac: a fault simulator for asynchronous sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 114-119, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Fsimac, gate-level fault simulator, Muller C-elements, complex domino gates, high-speed design, min-max timing analysis, min-max rime stamps, CA-BIST, waveform model, logic testing, built-in self test, timing, cellular automata, Cellular Automata, sequential circuits, iterative methods, fault simulation, fault simulator, asynchronous circuits, stuck-at faults, iterations, delay faults, combinational logic, feedback loops, pseudo-random tests, gate-delay faults, asynchronous sequential circuits |
26 | Brian Grayson, Saghir A. Shaikh, Stephen A. Szygenda |
Statistics on concurrent fault and design error simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 622-627, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
concurrent fault/design error simulation, design error simulation processes, c-sim, gate level concurrent simulator, event based statistics, gate evaluation statistics, simulator developers, hardware accelerator designers, design options, parallel algorithms, formal verification, circuit analysis computing, design verification, memory requirements, experimental data, concurrent simulators |
26 | Enric Pastor, Jordi Cortadella, Oriol Roig |
A new look at the conditions for the synthesis of speed-independent circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Great Lakes Symposium on VLSI ![In: 5th Great Lakes Symposium on VLSI (GLS-VLSI '95), March 16-18, 1995, The State University of New York at Buffalo, USA, pp. 230-, 1995, IEEE Computer Society, 0-8186-7035-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
gate-level synthesis, gate library constraint, fan-in reduction, VLSI, logic design, logic CAD, integrated circuit design, circuit CAD, integrated logic circuits, circuit optimisation, optimization techniques, speed-independent circuits |
26 | Ali Reza Ejlali, Seyed Ghassem Miremadi |
Switch-level emulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pp. 644-649, 2003, ACM, 1-58113-688-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
FPGA chips, gate-level models, emulation, switch-level models |
26 | C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal |
A STAFAN-like functional testability measure for register-level circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 192-198, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model |
25 | Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli |
Improving Gate-Level ATPG by Traversing Concurrent EFSMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 172-179, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
25 | Fei Li 0003, Lei He 0001, Joseph M. Basile, Rakesh J. Patel, Hema Ramamurthy |
High-level area and power-up current estimation considering rich cell library. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004, pp. 899-904, 2004, IEEE Computer Society, 0-7803-8175-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Sumit Ghosh, Tapan J. Chakraborty |
On behavior fault modeling for digital designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 2(2), pp. 135-151, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
fault coverage correlation, fault model, fault simulation, stuck-at fault, behavior model |
25 | Letícia Maria Veiras Bolzani, Edgar E. Sánchez, Matteo Sonza Reorda |
A software-based methodology for the generation of peripheral test sets based on high-level descriptions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2007, Copacabana, Rio de Janeiro, Brazil, September 3-6, 2007, pp. 348-353, 2007, ACM, 978-1-59593-816-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
RT-level test metrics, code coverage metrics, gate-level test metrics, test block, fault coverage, SoC testing |
24 | Eyad Alkassar, Peter Böhm, Steffen Knapp |
Formal Correctness of an Automotive Bus Controller Implementation at Gate-Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DIPES ![In: Distributed Embedded Systems: Design, Middleware and Resources, IFIP 20th World Computer Congress, TC10 Working Conference on Distributed and Parallel Embedded Systems (DIPES 2008), September 7-10, 2008, Milano, Italy, pp. 57-67, 2008, Springer, 978-0-387-09660-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
24 | Michael Boehner |
LOGEX - an Automatic Logic Extractor Form Transistor to Gate Level for CMOS Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 25th ACM/IEEE Conference on Design Automation, DAC '88, Anaheim, CA, USA, June 12-15, 1988., pp. 517-522, 1988, ACM. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP BibTeX RDF |
|
24 | Sriram Sambamurthy, Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham |
Functionally valid gate-level peak power estimation for processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 753-758, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Srivaths Ravi 0001, Indradeep Ghosh, Vamsi Boppana, Niraj K. Jha |
Fault-diagnosis-based technique for establishing RTL and gate-levelcorrespondences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(12), pp. 1414-1425, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
24 | Seyed Ghassem Miremadi, Ali Reza Ejlali |
Switch Level Fault Emulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPL ![In: Field Programmable Logic and Application, 13th International Conference, FPL 2003, Lisbon, Portugal, September 1-3, 2003, Proceedings, pp. 849-858, 2003, Springer, 3-540-40822-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Mark A. Hillebrand, Sergey Tverdyshev |
Formal Verification of Gate-Level Computer Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSR ![In: Computer Science - Theory and Applications, Fourth International Computer Science Symposium in Russia, CSR 2009, Novosibirsk, Russia, August 18-23, 2009. Proceedings, pp. 322-333, 2009, Springer, 978-3-642-03350-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001 |
A Novel Gate-Level NBTI Delay Degradation Model with Stacking Effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PATMOS ![In: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 17th International Workshop, PATMOS 2007, Gothenburg, Sweden, September 3-5, 2007, Proceedings, pp. 160-170, 2007, Springer, 978-3-540-74441-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Justin Lee, Joaquin Sitte |
Gate-level Morphogenetic Evolvable Hardware for Scalability and Adaptation on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AHS ![In: First NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2006), 15-18 June 2006, Istanbul, Turkey, pp. 145-152, 2006, IEEE Computer Society, 0-7695-2614-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Qi Wang, Sumit Roy 0003 |
RTL Power Optimization with Gate-Level Accuracy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2003 International Conference on Computer-Aided Design, ICCAD 2003, San Jose, CA, USA, November 9-13, 2003, pp. 39-45, 2003, IEEE Computer Society / ACM, 1-58113-762-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | J. W. Smith |
The gsim gate-level simulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Southeast Regional Conference ![In: Proceedings of the 38th Annual Southeast Regional Conference, 2000, Clemson, South Carolina, USA, April 7-8, 2000, pp. 67-76, 2000, ACM, 1-58113-250-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
23 | Alessandro Bogliolo, Luca Benini, Giovanni De Micheli, Bruno Riccò |
Gate-level power and current simulation of CMOS integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 5(4), pp. 473-488, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
23 | Kwang-Ting Cheng |
Gate-level test generation for sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 1(4), pp. 405-442, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
testing, automatic test generation, IC testing, sequential circuit test generation |
23 | Andres R. Takach, Niraj K. Jha |
Easily testable gate-level and DCVS multipliers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(7), pp. 932-942, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
23 | Nasir Mohyuddin, Ehsan Pakbaznia, Massoud Pedram |
Probabilistic error propagation in logic circuits using the Boolean difference calculus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings, pp. 7-13, 2008, IEEE Computer Society, 978-1-4244-2657-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Zuying Luo |
General transistor-level methodology on VLSI low-power design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 16th ACM Great Lakes Symposium on VLSI 2006, Philadelphia, PA, USA, April 30 - May 1, 2006, pp. 115-118, 2006, ACM, 1-59593-347-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
nanometer, transistor level, simulation, optimization |
23 | Pradip A. Thaker, Vishwani D. Agrawal, Mona E. Zaghloul |
A test evaluation technique for VLSI circuits using register-transfer level fault modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(8), pp. 1104-1113, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Fabrizio Ferrandi, G. Fornara, Donatella Sciuto, G. Ferrara, Franco Fummi |
Testability Alternatives Exploration through Functional Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 423-430, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
High-level Testability Analysis, Behavioral Test Generation, VHDL, ATPG |
23 | Manish Pandey, Alok Jain, Randal E. Bryant, Derek L. Beatty, Gary York, Samir Jain |
Extraction of finite state machines from transistor netlists by symbolic simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 596-601, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
finite state machine extraction, transistor netlists, clock level finite state machines, gate level representation, circuit clocking, output timing, simulation patterns, next state, output function, equivalent FSM, static storage structures, time multiplexed inputs, time multiplexed outputs, finite state machines, logic design, logic CAD, circuit analysis computing, FSMs, symbolic simulation, symbolic simulator, Ordered Binary Decision Diagrams |
23 | Shiu-Kai Chin, John Faust, Joseph Giordano |
Integrating formal methods tools to support system design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECCS ![In: 1st IEEE International Conference on Engineering of Complex Computer Systems (ICECCS '95), November 6-10, 1995, Fort Lauderdale, Florida, USA, pp. 88-, 1995, IEEE Computer Society, 0-8186-7123-8. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
formal methods tools integration, top-level process descriptions, gate-level hardware designs, simulators, formal specification, system design, specification languages, specification languages, systems analysis, system engineering, theorem-provers, computer-aided design tools, model checkers |
23 | Vivek Chickermane, Jaushin Lee, Janak H. Patel |
Addressing design for testability at the architectural level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(7), pp. 920-934, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
22 | Sergey Tverdyshev |
A verified platform for a gate-level electronic control unit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FMCAD ![In: Proceedings of 9th International Conference on Formal Methods in Computer-Aided Design, FMCAD 2009, 15-18 November 2009, Austin, Texas, USA, pp. 164-171, 2009, IEEE, 978-1-4244-4966-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
22 | Frank Sill, Frank Grassert, Dirk Timmermann |
Low power gate-level design with mixed-Vth (MVT) techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 17th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2004, Pernambuco, Brazil, September 7-11, 2004, pp. 278-282, 2004, ACM. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
MVT, leakage currents, threshold voltage |
22 | Aditya Bansal, Jae-Joon Kim, Keunwoo Kim, Saibal Mukhopadhyay, Ching-Te Chuang, Kaushik Roy 0001 |
Optimal Dual-VT Design in Sub-100 Nanometer PDSOI and Double-Gate Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 125-130, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
22 | Quming Zhou, Kartik Mohanram |
Gate sizing to radiation harden combinational logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(1), pp. 155-166, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
22 | Tae Il Bae, Jin Wook Kim, Young Hwan Kim |
New Gate Models for Gate-Level Delay Calculation under Crosstalk Effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(12), pp. 3488-3496, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
22 | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
Extending gate-level diagnosis tools to CMOS intra-gate faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 1(6), pp. 685-693, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
22 | Mohit Tiwari, Hassan M. G. Wassel, Bita Mazloom, Shashidhar Mysore, Frederic T. Chong, Timothy Sherwood |
Complete information flow tracking from the gates up. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASPLOS ![In: Proceedings of the 14th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2009, Washington, DC, USA, March 7-11, 2009, pp. 109-120, 2009, ACM, 978-1-60558-406-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
provably sound, gate level, information flow tracking |
22 | Xin Wang, Alireza Kasnavi, Harold Levy |
An Efficient Method for Fast Delay and SI Calculation Using Current Source Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA, pp. 57-61, 2008, IEEE Computer Society, 978-0-7695-3117-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Delay calculation, gate-level analysis, transient simulation, SI |
22 | Zhimin Chen, Yujie Zhou |
Dual-Rail Random Switching Logic: A Countermeasure to Reduce Side Channel Leakage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CHES ![In: Cryptographic Hardware and Embedded Systems - CHES 2006, 8th International Workshop, Yokohama, Japan, October 10-13, 2006, Proceedings, pp. 242-254, 2006, Springer, 3-540-46559-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Gate Level Masking, DRSL, Dual-Rail, Pre-charge, Side Channel Attacks, DPA |
22 | Kyu-won Choi, Abhijit Chatterjee |
HA2TSD: hierarchical time slack distribution for ultra-low power CMOS VLSI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2002 International Symposium on Low Power Electronics and Design, 2002, Monterey, California, USA, August 12-14, 2002, pp. 207-212, 2002, ACM, 1-58113-475-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
gate-level power optimization, time slack distribution, low-power design |
22 | Takeshi Sakamoto, Takashi Yamada, Mamoru Mukuno, Yoshifumi Matsushita, Yasoo Harada, Hiroto Yasuura |
Power analysis techniques for SoC with improved wiring models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2002 International Symposium on Low Power Electronics and Design, 2002, Monterey, California, USA, August 12-14, 2002, pp. 259-262, 2002, ACM, 1-58113-475-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
custom wire load model, SoC, power analysis, gate-level |
22 | Irith Pomeranz, Sudhakar M. Reddy |
On the feasibility of fault simulation using partial circuit descriptions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 108-113, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
partial circuit description, gate-level circuits, subcircuits, logic testing, fault simulation, fault simulation, memory requirements |
22 | Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero, Massimo Violante |
A genetic algorithm-based system for generating test programs for microprocessor IP cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICTAI ![In: 12th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2000), 13-15 November 2000, Vancouver, BC, Canada, pp. 195-198, 2000, IEEE Computer Society, 0-7695-0909-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
industrial property, genetic algorithm based system, test program generation, microprocessor IP cores, digital systems design trend, design-and-reuse paradigm, intellectual property cores, encrypted gate-level netlist, testability problems, automatic approach, processor cores, fault coverage figures, random approach, genetic algorithms, genetic algorithms, microprocessor chips, automatic test software, test program, electronic engineering computing |
22 | Kazumi Hatayama, Kazunori Hikone, Takeshi Miyazaki, Hiromichi Yamada |
A practical approach to instruction-based test generation for functional modules of VLSI processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 17-23, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
VLSI processors, instruction-based test generation, functional test pattern generation, gate level faults, constrained test generation, ALU oriented test pattern generation system, VLSI, functional modules, ALPS |
22 | Jitendra Khare, Wojciech Maly, Nathan Tiday |
Fault characterization of standard cell libraries using inductive contamination. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 405-413, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
surface contamination, fault characterization, standard cell libraries, inductive contamination analysis, contamination diagnosis, gate-level delay characterization, fault diagnosis, test generation, integrated circuit testing, cellular arrays, defect coverage |
22 | Franco Fummi, Donatella Sciuto, M. Serro |
Synthesis for testability of large complexity controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 180-185, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
large complexity controllers, industrial design environments, top-down methodology, hierarchical descriptions, irredundant circuits, optimized gate-level descriptions, testable descriptions, specification, high level synthesis, finite state machines, finite state machines, design for testability, design for testability, VHDL, automatic testing, logic CAD, hardware description languages, FSM, synthesis for testability, logic gates |
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