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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 46 occurrences of 38 keywords
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Results
Found 237 publication records. Showing 237 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
10 | David Wolpert 0001, Paul Ampadu |
Normal and Reverse Temperature Dependence in Variation-Tolerant Nanoscale Systems with High-k Dielectrics and Metal Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NanoNet ![In: Nano-Net - Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers, pp. 14-18, 2008, Springer, 978-3-642-02426-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Reverse temperature dependence, high-k dielectric, variation-tolerant, metal gate |
10 | A. Madan, S. C. Bose, P. J. George, Chandra Shekhar 0001 |
Evaluation of Device Parameters of HfO2/SiO2/Si Gate Dielectric Stack for MOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India, pp. 386-391, 2005, IEEE Computer Society, 0-7695-2264-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Direct Tunneling, gate leakage current, high-K gate stack, MOSFETs |
9 | Joseph Casamento, Kazuki Nomoto, Thai-Son Nguyen, Hyunjea Lee, Chandrasekhar Savant, Lei Li 0023, Austin Hickman, Takuya Maeda, Yu-Tsun Shao, Jimy Encomendero, Ved Gund, Timothy Vasen, Shamima Afroz, Daniel J. Hannan, David A. Muller, Huili Grace Xing, Debdeep Jena |
AlScN High Electron Mobility Transistors: Integrating High Piezoelectric, High K Dielectric, and Ferroelectric Functionality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BCICTS ![In: IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023, pp. 132-136, 2023, IEEE, 979-8-3503-0764-1. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
8 | Ru Huang, HanMing Wu, Jinfeng Kang, DeYuan Xiao, XueLong Shi, Xia An, Yu Tian, Runsheng Wang, Liangliang Zhang, Xing Zhang 0002, Yangyuan Wang |
Challenges of 22 nm and beyond CMOS technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. China Ser. F Inf. Sci. ![In: Sci. China Ser. F Inf. Sci. 52(9), pp. 1491-1533, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
22 nm technology node, device architectures, metal gate/high K dielectrics, ultra low K dielectrics, CMOS technology |
8 | Yangyuan Wang, Xing Zhang 0002, Xiaoyan Liu, Ru Huang |
Novel devices and process for 32 nm CMOS technology and beyond. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. China Ser. F Inf. Sci. ![In: Sci. China Ser. F Inf. Sci. 51(6), pp. 743-755, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
high-k, non-planar MOSFET, quasi-ballistic transport, CMOS technology, metal gate |
7 | Kelin J. Kuhn |
CMOS scaling beyond 32nm: challenges and opportunities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009, pp. 310-313, 2009, ACM, 978-1-60558-497-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
high-k, CMOS, orientation, strain, metal-gate |
6 | Samar K. Saha |
Modeling Process Variability in Scaled CMOS Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 27(2), pp. 8-16, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
compact variability modeling, gate-oxide thickness variability, high-k dielectric, line-edge roughness, polysilicon granularity, random discrete dopants, scaled CMOS technology, statistical compact modeling, design and test, process variability, metal gate |
6 | Tae-Hwan Hyun, Won-Ju Cho |
Pushing the Limits of Biosensing: Selective Calcium Ion Detection with High Sensitivity via High-k Gate Dielectric Engineered Si Nanowire Random Network Channel Dual-Gate Field-Effect Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(15), pp. 6720, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
6 | Kamal Hosen, Md. Sherajul Islam, Catherine Stampfl, Jeongwon Park |
Numerical Analysis of Gate-All-Around HfO2/TiO2/HfO2 High-K Dielectric Based WSe2 NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 9, pp. 116254-116264, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
6 | Shaun Chou, Gu-Huan Li, Shawn Chen, Jun-Hao Chang, Wan-Hsueh Cheng, Shao-Ding Wu, Philex Fan, Chia-En Huang, Yu-Der Chih, Yih Wang, Jonathan Chang |
A 16Kb Antifuse One-Time-Programmable Memory in 5nm High-K Metal-Gate Fin-FET CMOS Featuring Bootstrap High Voltage Scheme, Read Endpoint Detection and Pseudo-Differential Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Circuits ![In: 2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, pp. 1-2, 2021, IEEE, 978-4-86348-780-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
6 | Yutao Cai, Yang Wang, Ye Liang, Yuanlei Zhang, Wen Liu 0010, Huiqing Wen, Ivona Z. Mitrovic, Cezhou Zhao |
Effect of High-k Passivation Layer on High Voltage Properties of GaN Metal-Insulator-Semiconductor Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 95642-95649, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
6 | Jing-Chyi Liao, Paul Ko, M. H. Hsieh, Zheng Zeng |
Self-healing LDMOSFET for high-voltage application on high-k/metal gate CMOS process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-3, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
6 | Deepa Anand, M. Swathi, A. Purushothaman, Sundararaman Gopalan |
Assessing the Performance of CMOS Amplifiers Using High-k Dielectric with Metal Gate on High Mobility Substrate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICACDS (1) ![In: Advances in Computing and Data Sciences - Second International Conference, ICACDS 2018, Dehradun, India, April 20-21, 2018, Revised Selected Papers, Part I, pp. 279-289, 2018, Springer, 978-981-13-1809-2. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
6 | Shweta Shree, Umesh Chandra Pancholi |
Fabrication and study of various characteristics of high performance iii-v mosfets with high-k dielectrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICACCI ![In: 2017 International Conference on Advances in Computing, Communications and Informatics, ICACCI 2017, Udupi (Near Mangalore), India, September 13-16, 2017, pp. 338-343, 2017, IEEE, 978-1-5090-6367-3. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
6 | Sheng-Po Fang, Kyoung-Tae Kim, Todd Schumann, Yong-Kyu Yoon |
Fabrication of high-aspect-ratio nanoporous high-k MTiO3 (M= Ba, Sr, or BaxSr1-x) using anodization and hydrothermal processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NEMS ![In: 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017, Los Angeles, CA, USA, April 9-12, 2017, pp. 235-238, 2017, IEEE, 978-1-5090-3059-0. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
6 | A. Benoist, S. Denorme, X. Federspiel, Bruno Allard, Philippe Candelier |
Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015, pp. 3, 2015, IEEE, 978-1-4673-7362-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
6 | Jungyul Pyo, Youngmin Shin, Hoi-Jin Lee, Sung-il Bae, Min-Su Kim, Kwangil Kim, Ken Shin, Yohan Kwon, Heungchul Oh, Jaeyoung Lim, Dong-Wook Lee, Jongho Lee, Inpyo Hong, Kyungkuk Chae, Heon-Hee Lee, Sung-Wook Lee, Seongho Song, Chunghee Kim, Jin-Soo Park, Heesoo Kim, Sunghee Yun, Ukrae Cho, Jae Cheol Son, Sungho Park |
23.1 20nm high-K metal-gate heterogeneous 64b quad-core CPUs and hexa-core GPU for high-performance and energy-efficient mobile application processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015, Digest of Technical Papers, San Francisco, CA, USA, February 22-26, 2015, pp. 1-3, 2015, IEEE, 978-1-4799-6223-5. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
6 | S. H. Yang, J. Y. Sheu, M. K. Ieong, M. H. Chiang, T. Yamamoto, J. J. Liaw, S. S. Chang, Y. M. Lin, T. L. Hsu, J. R. Hwang, J. K. Ting, C. H. Wu, K. C. Ting, F. C. Yang, C. M. Liu, I. L. Wu, Y. M. Chen, S. J. Chent, K. S. Chen, J. Y. Cheng, M. H. Tsai, W. Chang, R. Chen, C. C. Chen, T. L. Lee, C. K. Lin, S. C. Yang, Y. M. Sheu, J. T. Tzeng, L. C. Lu, S. M. Jang, Carlos H. Diaz, Yuh-Jier Mii |
28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011, pp. 1-5, 2011, IEEE, 978-1-4577-0222-8. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
6 | W. Polspoel, Wilfried Vandervorst, Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich |
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 48(8-9), pp. 1521-1524, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
6 | Y. H. Kim, Rino Choi, R. Jha, J. H. Lee, Veena Misra, J. C. Lee |
Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and Interfacial / High-K Bi-Layer Structure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 44(9-11), pp. 1513-1518, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
5 | Nihar R. Mohapatra, Madhav P. Desai, V. Ramgopal Rao |
Detailed Analysis of FIBL in MOS Transistors with High-K Gate Dielectrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India, pp. 99-104, 2003, IEEE Computer Society, 0-7695-1868-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
5 | Nihar R. Mohapatra, Arijit Dutta, Madhav P. Desai, V. Ramgopal Rao |
Effect Of Fringing Capacitances In Sub 100 Nm Mosfet's With High-K Gate Dielectrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India, pp. 479-, 2001, IEEE Computer Society, 0-7695-0831-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
4 | Garima Thakral, Saraju P. Mohanty, Dhruva Ghai, Dhiraj K. Pradhan |
A DOE-ILP assisted conjugate-gradient based power and stability optimization in High-K Nano-CMOS SRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 323-328, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
nano-CMOS, power, leakage, SRAM, static noise margin |
4 | Chenyue Ma, Bo Li, Lining Zhang, Jin He 0003, Xing Zhang 0002, Xinnan Lin, Mansun Chan |
A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 7-12, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
4 | D. Vinay Kumar, Nihar R. Mohapatra, Mahesh B. Patil, V. Ramgopal Rao |
Application of Look-up Table Approach to High-K Gate Dielectric MOS Transistor circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India, pp. 128-, 2003, IEEE Computer Society, 0-7695-1868-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
3 | Lijuan Wu, Tao Qiu, Xuanting Song, Banghui Zhang, Heng Liu, Qing Liu |
Analytical model for high-k SOI pLDMOS with self-adaptive balance of polarization charge. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 132, pp. 105677, February 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
3 | X. Federspiel, A. Griffon, M. Barlas, P. Lamontagne |
Effect of Frequency on Reliability Of High-K MIM Capacitors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-6, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
3 | Shraddha Pali, Ankur Gupta |
High-k field plate DeNMOS design for enhanced performance and electrothermal SOA in switching applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 130, pp. 105615, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
3 | Ravi Achanta, V. McGahay, S. Boffoli, C. Kothandaraman, J. Gambino |
High-k MIM dielectric reliability study in 65nm node. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 32-1, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
3 | Yiming Qu, Yang Shen, Mingji Su, Jiwu Lu, Yi Zhao |
GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 3, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
3 | Chih-Feng Yen, Yu-Ya Huang, Shen-Hao Tsao, Shih-Hao Lin, Chun-Hu Cheng |
Influence of Y2O3 Doped HfO2 High-k Films on Electrical Properties of MOS and MIM Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICKII ![In: 5th IEEE International Conference on Knowledge Innovation and Invention, ICKII 2022, Hualien, Taiwan, July 22-24, 2022, pp. 225-229, 2022, IEEE, 978-1-6654-7929-5. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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3 | L. Breuil, L. Nyns, S. Rachidi, K. Banerjee, Antonio Arreghini, J. Bastos, S. Ramesh, G. Van den Bosch, Maarten Rosmeulen |
High-K incorporated in a SiON tunnel layer for 3D NAND programming voltage reduction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IMW ![In: IEEE International Memory Workshop, IMW 2022, Dresden, Germany, May 15-18, 2022, pp. 1-4, 2022, IEEE, 978-1-6654-9947-7. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
3 | Vishank Talesara, Yuxuan Zhang, Junao Cheng, Hongping Zhao, Wu Lu |
Breakdown Voltage Enhancement of GaN diodes with High-k Dielectric. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: Device Research Conference, DRC 2022, Columbus, OH, USA, June 26-29, 2022, pp. 1-2, 2022, IEEE, 978-1-6654-9883-8. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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3 | Ana Ruiz, Carlos Couso, Natalia Seoane, Marc Porti, Antonio J. García-Loureiro, Montserrat Nafría |
Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 9, pp. 90568-90576, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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3 | Sarika Madhukar Jagtap, Vitthal Janardan Gond |
Performance Parameter Evaluation of 7nm FinFET by Tuning Metal Work Function and High K Dielectrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nat. Comput. Res. ![In: Int. J. Nat. Comput. Res. 10(3), pp. 12-28, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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3 | Bingfei Dou, Siwei Huang, Jiajin Song, Xiao Li, Zongming Duan, Xiaojiang Yao, Dongping Xiao, Yongjie Li 0002, Liguo Sun |
A 21.6dBm CMOS power amplifier using a compact high-k output transformer for X-band application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Electron. Express ![In: IEICE Electron. Express 18(21), pp. 20210377, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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3 | Konner E. K. Holden, Gavin D. R. Hall, Michael Cook 0004, Chris Kendrick, Kaitlyn Pabst, Bruce Greenwood, Robin Daugherty, Jeff P. Gambino, Derryl D. J. Allman |
Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-10, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
3 | Hongxia Liu, Guodu Han, Dong Wang |
Research on Transparent Resistive Random Memory Based on Lanthanum-based High-k Medium. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-3867-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
3 | Rui Li, Mingmin Huang, Xi Zhang, Min Hu, Zhimei Yang, Yao Ma, Min Gong |
Superjunction MOSFET with Trench Schottky Contact and Embedded High-k Insulator for Excellent Reverse Recovery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-3867-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
3 | Pooja Srivastava, S. C. Bose |
Simulated Analysis of Double-Gate MOSFET and FinFET Structure Using High-k Materials. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMS2 ![In: Computing Science, Communication and Security - Second International Conference, COMS2 2021, Gujarat, India, February 6-7, 2021, Revised Selected Papers, pp. 276-286, 2021, Springer, 978-3-030-76775-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
3 | Walid Amir, Dae-Hyun Kim, Tae-Woo Kim |
Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 211464-211473, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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3 | Aakash Kumar Jain, Mamidala Jagadesh Kumar |
Sub-10 nm Scalability of Junctionless FETs Using a Ground Plane in High-K BOX: A Simulation Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 137540-137548, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Junji Cheng, Jingjie Lin, Weizhen Chen, Shiying Wu, Haimeng Huang, Bo Yi |
Lateral Power Fin MOSFET With a High-k Passivation for Ultra-Low On-Resistance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 48991-48999, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Saurav Roy, Arkka Bhattacharyya, Sriram Krishnamoorthy |
Analytical Modeling and Design of Gallium Oxide Schottky Barrier Diodes Beyond Unipolar Figure of Merit Using High-k Dielectric Superjunction Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2008.00280, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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3 | Shun'ichiro Ohmi, Shin Ishimatsu, Yuske Horiuchi, Sohya Kudoh |
In-Situ N2-Plasma Nitridation for High-k HfN Gate Insulator Formed by Electron Cyclotron Resonance Plasma Sputtering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 103-C(6), pp. 299-303, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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3 | Ygor Fonseca, Rafael Nóbrega, Ulysses Duarte, Thiago R. Raddo, Iyad Dayoub, Anderson L. Sanches, Murilo Bellezoni Loiola |
Analysis of Si and GaN GAA-NW-FETs in High-k Gate Oxides for Next Generation Mobile Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSNDSP ![In: 12th International Symposium on Communication Systems, Networks and Digital Signal Processing, CSNDSP 2020, Porto, Portugal, July 20-22, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-6743-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Ying-Jun Deng, Hao-Lun Hu, Yu-Han Liang, Jian-Ming Chen, Ching-Chuan Chou, Shea-Jue Wang, Mu-Chun Wang |
Q-factor Integrity of 28nm-node High-k Gate Dielectric. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICKII ![In: 3rd IEEE International Conference on Knowledge Innovation and Invention, ICKII 2020, Kaohsiung, Taiwan, August 21-23, 2020, pp. 71-73, 2020, IEEE, 978-1-7281-9333-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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3 | Yu-Chen Lin, Kai-Chun Zhan, Ji-Min Zhang, Jian-Ming Chen, Cheng-Hsun-Tony Chang, Shea-Jue Wang, Mu-Chun Wang |
Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICKII ![In: 3rd IEEE International Conference on Knowledge Innovation and Invention, ICKII 2020, Kaohsiung, Taiwan, August 21-23, 2020, pp. 64-66, 2020, IEEE, 978-1-7281-9333-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Si-Ping Li, Jia-Wei Xu, Wei-Hao Li, Jian-Ming Chen, Chao-Nan Wei, Wen-How Lan, Mu-Chun Wang |
Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICKII ![In: 3rd IEEE International Conference on Knowledge Innovation and Invention, ICKII 2020, Kaohsiung, Taiwan, August 21-23, 2020, pp. 67-70, 2020, IEEE, 978-1-7281-9333-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Kyung Eun Park, Shun'ichiro Ohmi |
High-k LaBxNy gate insulator formed by the Ar/N2 plasma sputtering of N-doped LaB6 metal thin films and its application to floating-gate memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: 2020 Device Research Conference, DRC 2020, Columbus, OH, USA, June 21-24, 2020, pp. 1-2, 2020, IEEE, 978-1-7281-7047-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Akanksha Rohit, Yunus Kelestemur, Savas Kaya, Parthiban Rajan |
Ultra-Durable and Reliable High-k Textile Capacitors for Wearables and Robotics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: 2020 Device Research Conference, DRC 2020, Columbus, OH, USA, June 21-24, 2020, pp. 1-2, 2020, IEEE, 978-1-7281-7047-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
3 | Swarnil Roy, Sagar Mukherjee, Arka Dutta, Chandan Kumar Sarkar, Chayanika Bose |
Circuit performance analysis of graded doping of channel of DGMOS with high-k gate stack for analogue and digital application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Circuits Devices Syst. ![In: IET Circuits Devices Syst. 13(3), pp. 337-343, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Avtar Singh, Saurabh Chaudhury, Chandan Kumar Pandey, Savitesh Madhulika Sharma, Chandan Kumar Sarkar |
Design and analysis of high k silicon nanotube tunnel FET device. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Circuits Devices Syst. ![In: IET Circuits Devices Syst. 13(8), pp. 1305-1310, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Wei-feng Lü, Liang Dai |
Impact of work-function variation on analog figures-of-merits for high-k/metal-gate junctionless FinFET and gate-all-around nanowire MOSFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 84, pp. 54-58, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Chandreswar Mahata, Wonwoo Kim, Shiwhan Kim, Muhammad Ismail, Min-Hwi Kim, Sungjun Kim, Byung-Gook Park |
Reversible nonvolatile and threshold switching characteristics in Cu/high-k/Si devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Electron. Express ![In: IEICE Electron. Express 16(16), pp. 20190404, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Yueyang Liu, Xiangwei Jiang, Liwei Wang 0003, Yunfei En, Runsheng Wang |
Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, pp. 1-4, 2019, IEEE, 978-1-5386-9504-3. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | E. R. Hsieh, C. W. Chang, C. C. Chuang, H. W. Chen, Steve S. Chung |
The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Circuits ![In: 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, pp. 208-, 2019, IEEE, 978-4-86348-720-8. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Yutao Cai, Yang Wang, Miao Cui, Wen Liu 0010, Huiqing Wen, Cezhou Zhao, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker |
Effect of High-k Passivation Layer on Electrical Properties of GaN Metal-Insulator-Semiconductor Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: International Conference on IC Design and Technology, ICICDT 2019, Suzhou, China, June 17-19, 2019, pp. 1-5, 2019, IEEE, 978-1-7281-1853-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Han Wui Then, Sansaptak Dasgupta, Marko Radosavljevic, Sanaz Gardner, Seung-Hoon Sung, Paul Fischer |
High-K Gate Dielectric GaN MOS-HEMTs with Regrown n+ InGaN Source/Drain (Invited Paper). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: Device Research Conference, DRC 2019, Ann Arbor, MI, USA, June 23-26, 2019, pp. 39-40, 2019, IEEE, 978-1-7281-2111-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
3 | Balaji Jayaraman, Derek Leu, Janakiraman Viraraghavan, Alberto Cestero, Ming Yin, John Golz, Rajesh Reddy Tummuru, Ramesh Raghavan, Dan Moy, Thejas Kempanna, Faraz Khan, Toshiaki Kirihata, Subramanian S. Iyer |
80-kb Logic Embedded High-K Charge Trap Transistor-Based Multi-Time-Programmable Memory With No Added Process Complexity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 53(3), pp. 949-960, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Rajneesh Sharma, Rituraj S. Rathore, Ashwani K. Rana |
Impact of High-k Spacer on Device Performance of Nanoscale Underlap Fully Depleted SOI MOSFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 27(4), pp. 1850063:1-1850063:13, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Minjung Jin, Kangjung Kim, Yoohwan Kim, Hyewon Shim, Jinju Kim, Gunrae Kim, Sangwoo Pae |
Investigation of BTI characteristics and its behavior on 10 nm SRAM with high-k/metal gate FinFET technology having multi-VT gate stack. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 81, pp. 201-209, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Jiangwei Liu, Yasuo Koide |
An Overview of High-k Oxides on Hydrogenated-Diamond for Metal-Oxide-Semiconductor Capacitors and Field-Effect Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 18(6), pp. 1813, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Nicolo Oliva, Emanuele A. Casu, Matteo Cavalleri, Adrian M. Ionescu |
Double gate n-type WSe2 FETs with high-k top gate dielectric and enhanced electrostatic control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018, pp. 114-117, 2018, IEEE, 978-1-5386-5401-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Badreddine Zerroumda, Fayçal Djeffal, Toufik Bentrcia, Hichem Ferhati |
Numerical Analysis of 4H-SiC MOSFET Design Including High-k Gate Dielectrics for Power electronic Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSENT ![In: Proceedings of the 7th International Conference on Software Engineering and New Technologies, ICSENT 2018, Hammamet, Tunisia, December 26-28, 2018, pp. 35:1-35:5, 2018, ACM, 978-1-4503-6101-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | D. S. Huang, J. H. Lee, Y. S. Tsai, Y. F. Wang, Y. S. Huang, C. K. Lin, Ryan Lu, Jun He |
Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 6, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Weizhen Chen, Junji Cheng, Jingjie Lin, Xingbi Chen |
Simulation study on the high-k SJ-VDMOS with gradient side-wall. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIPRO ![In: 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018, Opatija, Croatia, May 21-25, 2018, pp. 60-65, 2018, IEEE, 978-953-233-095-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Eric Hunt-Schroeder, Darren Anand, John A. Fifield, Mark Jacunski, Michael Roberge, Dale E. Pontius, Kevin Batson, Toshiaki Kirihata |
14NM FinFET 1.5MB Embedded High-K Charge Trap Transistor One Time Programmable Memory Using Dynamic Adaptive Programming. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Circuits ![In: 2018 IEEE Symposium on VLSI Circuits, Honolulu, HI, USA, June 18-22, 2018, pp. 87-88, 2018, IEEE, 978-1-5386-4214-6. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Yun-Sheng Chan, Po-Tsang Huang, Shang-Lin Wu, Sheng-Chi Lung, Wei-Chang Wang, Wei Hwang, Ching-Te Chuang |
0.4V Reconfigurable Near-Threshold TCAM in 28nm High-k Metal-Gate CMOS Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SoCC ![In: 31st IEEE International System-on-Chip Conference, SOCC 2018, Arlington, VA, USA, September 4-7, 2018, pp. 272-277, 2018, IEEE, 978-1-5386-1491-4. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Anna Grazia Monteduro, Zoobia Ameer, Silvia Rizzato, Angelo Leo, Maurizio Martino, Anna Paola Caricato, Vittorianna Tasco, Indira Chaitanya Lekshmi, Abhijit Hazarika, Debraj Choudhury, Elisabetta Mazzotta, Cosimino Malitesta, D. D. Sarma, Giuseppe Maruccio |
High-k YCTO thin films for electronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: 2018 International Conference on IC Design & Technology, ICICDT 2018, Otranto, Italy, June 4-6, 2018, pp. 189-192, 2018, IEEE, 978-1-5386-2550-7. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Jeffrey A. Smith, Hideki Takeuchi, Robert Stephenson, Yi-Ann Chen, Marek Hytha, Robert J. Mears, Suman Datta |
Experimental Investigation of N-Channel Oxygen-Inserted (OI) Silicon Channel MOSFETs with High-K/Metal Gate Stack. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018, pp. 1-2, 2018, IEEE, 978-1-5386-3027-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Namphung Peimyoo, Jake Mehew, Matt D. Barnes, Adolfo De Sanctis, Iddo Amit, Janire Escolar, Konstantinos Anastasiou, Ali Gholina, Aidan P. Rooney, Sarah Haigh, Saverio Russo, Monica Felicia Craciun, Freddie Withers |
Photo-oxidized HfS2 - An embeddable and writable high-k dielectric for flexible Van der Waals nano-electronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018, pp. 1-2, 2018, IEEE, 978-1-5386-3027-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
3 | Shimpei Yamaguchi, Zeynel Bayindir, Xiaoli He, Suresh Uppal, Purushothaman Srinivasan, Chloe Yong, Dongil Choi, Manoj Joshi, Hyuck Soo Yang, Owen Hu, Srikanth Samavedam, Dong Kyun Sohn |
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 72, pp. 80-84, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
3 | Slah Hlali, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi |
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 75, pp. 154-161, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
3 | Mengnan Ke, Mitsuru Takenaka, Shinichi Takagi |
Understanding of slow traps generation in plasma oxidation GeOx/Ge MOS interfaces with ALD high-k layers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017, pp. 296-299, 2017, IEEE, 978-1-5090-5978-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
3 | Jonathan Chang, Yen-Huei Chen, Wei-Min Chan, Sahil Preet Singh, Hank Cheng, Hidehiro Fujiwara, Jih-Yu Lin, Kao-Cheng Lin, John Hung, Robin Lee, Hung-Jen Liao, Jhon-Jhy Liaw, Quincy Li, Chih-Yung Lin, Mu-Chi Chiang, Shien-Yang Wu |
12.1 A 7nm 256Mb SRAM in high-k metal-gate FinFET technology with write-assist circuitry for low-VMIN applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017, San Francisco, CA, USA, February 5-9, 2017, pp. 206-207, 2017, IEEE, 978-1-5090-3758-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
3 | D. H. Triyoso, G. R. Mulfinger, K. Hempel, H. Tao, F. Koehler, L. Kang, A. Kumar, T. McArdle, J. Holt, A. L. Child, S. Straub, F. Ludwig, Z. Chen, J. Kluth, Rick Carter |
Characterization of atomic layer deposited low-k spacer for FDSOI high-k metal gate transistor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: 2017 IEEE International Conference on IC Design and Technology, ICICDT 2017, Austin, TX, USA, May 23-25, 2017, pp. 1-4, 2017, IEEE, 978-1-5090-4502-0. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
3 | Kai-Ping Chang, Han-Hsiang Tai, Jer-Chyi Wang, Chao-Sung Lai |
Graphene nanodots with high-k dielectrics for flash memory applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017, pp. 433-435, 2017, IEEE, 978-1-5090-6625-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
3 | Tilo Köckritz, René Luther, Georgi Paschew, Irene Jansen, Andreas Richter, Oliver Jost, Andreas Schönecker, Eckhard Beyer |
Full Polymer Dielectric Elastomeric Actuators (DEA) Functionalised with Carbon Nanotubes and High-K Ceramics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Micromachines ![In: Micromachines 7(10), pp. 172, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Sanjit Kumar Swain, Arka Dutta, Sarosij Adak, Sudhansu Kumar Pati, Chandan Kumar Sarkar |
Influence of channel length and high-K oxide thickness on subthreshold analog/RF performance of graded channel and gate stack DG-MOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 61, pp. 24-29, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Feng Ji, Jing-Ping Xu, Lu Liu, Wing Man Tang, Pui To Lai |
A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 57, pp. 24-33, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Andreas Kerber |
Device to circuit reliability correlations for metal gate/high-k transistors in scaled CMOS technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 64, pp. 145-151, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Janakiraman Viraraghavan, Derek Leu, Balaji Jayaraman, Alberto Cestero, Robert Kilker, Ming Yin, John Golz, Rajesh Reddy Tummuru, Ramesh Raghavan, Dan Moy, Thejas Kempanna, Faraz Khan, Toshiaki Kirihata, Subramanian S. Iyer |
80Kb 10ns read cycle logic Embedded High-K charge trap Multi-Time-Programmable Memory scalable to 14nm FIN with no added process complexity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Circuits ![In: 2016 IEEE Symposium on VLSI Circuits, VLSIC 2016, Honolulu, HI, USA, June 15-17, 2016, pp. 1-2, 2016, IEEE, 978-1-5090-0635-9. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Bo Song, Jianliang Gao, Weimao Ke, Xiaohua Hu 0001 |
Achieving high k-coverage and k-consistency in global alignment of multiple PPI networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BIBM ![In: IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2016, Shenzhen, China, December 15-18, 2016, pp. 303-307, 2016, IEEE Computer Society, 978-1-5090-1611-2. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Shraddha Thakre, Ankur Beohar, Vikas Vijayvargiya, Nandakishor Yadav, Santosh Kumar Vishvakarma |
Investigation of DC Characteristic on DG-Tunnel FET with High-K Dielectric Using Distinct Device Parameter. ![Search on Bibsonomy](Pics/bibsonomy.png) |
iNIS ![In: IEEE International Symposium on Nanoelectronic and Information Systems, iNIS 2016, Gwalior, India, December 19-21, 2016, pp. 124-128, 2016, IEEE, 978-1-5090-6170-9. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Nandakishor Yadav, Ankur Beohar, Santosh Kumar Vishvakarma |
Analysis of Single-Trap-Induced Random Telegraph Noise on Asymmetric High-k Spacer FinFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
iNIS ![In: IEEE International Symposium on Nanoelectronic and Information Systems, iNIS 2016, Gwalior, India, December 19-21, 2016, pp. 264-267, 2016, IEEE, 978-1-5090-6170-9. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
3 | Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori |
A 28 nm High-k/MG Heterogeneous Multi-Core Mobile Application Processor With 2 GHz Cores and Low-Power 1 GHz Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 50(1), pp. 92-101, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim |
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 23(7), pp. 1360-1364, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | Binola K. Jebalin, A. Shobha Rekh, P. Prajoon, N. Mohankumar 0002, D. Nirmal |
The influence of high-k passivation layer on breakdown voltage of Schottky AlGaN/GaN HEMTs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 46(12), pp. 1387-1391, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | K. C. Lin, P. C. Juan, C. H. Liu, Mu-Chun Wang, C. H. Chou |
Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 55(11), pp. 2198-2202, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | Hsien-Chin Chiu, Chia-Hsuan Wu, Ji-Fan Chi, Jen-Inn Chyi, Geng-Yen Lee |
N2O treatment enhancement-mode InAlN/GaN HEMTs with HfZrO2 High-k insulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 55(1), pp. 48-51, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | Mattia Capriotti, Clément Fleury, Ole Bethge, Matteo Rigato, Suzanne Lancaster, Dionyz Pogany, Gottfried Strasser, Eldad Bahat-Treidel, Oliver Hilt, Frank Brunner, Joachim Würfl |
E-mode AlGaN/GaN True-MOS, with high-k ZrO2 gate insulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015, pp. 60-63, 2015, IEEE, 978-1-4673-7133-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | M. N. Chang, Y.-H. Lee, S. Y. Lee, C. C. Chiu, D. Maji, K. Wu |
An investigation of capacitance aging model for extreme low-k and high-k dielectrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015, pp. 3, 2015, IEEE, 978-1-4673-7362-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | P. Srinivasan, J. Fronheiser, S. Siddiqui, A. Kerber, L. F. Edge, Richard G. Southwick, Eduard Cartier |
NBTI in Si0.5Ge0.5 RMG gate stacks - Effect of high-k nitridation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015, pp. 2, 2015, IEEE, 978-1-4673-7362-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | A. Kerber |
Impact of RTN on stochastic BTI degradation in scaled metal gate/high-k CMOS technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015, pp. 3, 2015, IEEE, 978-1-4673-7362-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | A. Bezza, M. Rafik, David Roy 0001, X. Federspiel, P. Mora, Cheikh Diouf, Vincent Huard, Gérard Ghibaudo |
Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015, pp. 5, 2015, IEEE, 978-1-4673-7362-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
3 | G. Sereni, Luca Vandelli, Roberto Cavicchioli, Luca Larcher, Dmitry Veksler, Gennadi Bersuker |
Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015, pp. 2, 2015, IEEE, 978-1-4673-7362-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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3 | Minki Cho, Carlos Tokunaga, Muhammad M. Khellah, James W. Tschanz, Vivek De |
Aging-aware Adaptive Voltage Scaling in 22nm high-K/metal-gate tri-gate CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015, pp. 1-4, 2015, IEEE, 978-1-4799-8682-8. The full citation details ...](Pics/full.jpeg) |
2015 |
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3 | Kanchan Cecil, Jawar Singh |
Performance Enhancement of Dopingless Tunnel-FET Based on Ge-Source with High-k. ![Search on Bibsonomy](Pics/bibsonomy.png) |
iNIS ![In: IEEE International Symposium on Nanoelectronic and Information Systems, iNIS 2015, Indore, India, December 21-23, 2015, pp. 19-22, 2015, IEEE, 978-1-4673-9692-9. The full citation details ...](Pics/full.jpeg) |
2015 |
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3 | Sanjeev Kumar Sharma, Balwinder Raj, Mamta Khosla |
Performance enhancement of junctionless nanowire FET with laterally graded channel doping and high-K spacers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GCCE ![In: IEEE 4th Global Conference on Consumer Electronics, GCCE 2015, Osaka, Japan, 27-30 October 2015, pp. 556-559, 2015, IEEE. The full citation details ...](Pics/full.jpeg) |
2015 |
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