Search results for "hot-carrier"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
88	Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami	GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.	ISQED	2000	DBLP DOI BibTeX RDF	Hot Carrier Effect, Gate level modeling, Gate level simulation, Circuit reliability simulation, VLSI
76	Xiangdong Xuan, Abhijit Chatterjee	Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects.	DFT	2001	DBLP DOI BibTeX RDF	hot-carrier, hierarchical analysis, hot-spot, performance degradation, Electromigration
70	Yang Liu, Ashok Kumar Srivastava, Yao Xu	A switchable PLL frequency synthesizer and hot carrier effects.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	cmos phase-locked loop, hot carrier effects, jitter, voltage-controlled oscillator, phase noise
70	Yusuf Leblebici, Sung-Mo Kang	Modeling of nMOS transistors for simulation of hot-carrier-induced device and circuit degradation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
63	Wei Li, Qiang Li 0039, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates	Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology.	ISQED	2001	DBLP DOI BibTeX RDF
56	P. Srinivasan 0002, B. Vootukuru, Durga Misra	Screening of Hot Electron Effect During Plasma Processing.	VLSI Design	2004	DBLP DOI BibTeX RDF
45	Ping-Chung Li, Ibrahim N. Hajj	Computer-aided redesign of VLSI circuits for hot-carrier reliability.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
45	Ping-Chung Li, Georgios I. Stamoulis, Ibrahim N. Hajj	A probabilistic timing approach to hot-carrier effect estimation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
44	Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider	Practical aspects of reliability analysis for IC designs.	DAC	2006	DBLP DOI BibTeX RDF	ESD, TDDB of intermetal dielectric, design-in reliability, gate oxide integrity, hot carrier stress, stress-induced voiding, NBTI, electromigration
44	Suresh Srinivasan, Prasanth Mangalagiri, Yuan Xie 0001, Narayanan Vijaykrishnan, Karthik Sarpatwari	FLAW: FPGA lifetime awareness.	DAC	2006	DBLP DOI BibTeX RDF	hot carrier effects, time dependent dielecric breakdown, FPGA, electromigration
44	Andy Negoi, Alain Guyot, Jacques Zimmermann	A dedicated circuit for charged particles simulation using the Monte Carlo method.	ASAP	1997	DBLP DOI BibTeX RDF	dedicated circuit, charged particles simulation, dedicated integrated circuit, integro-differential Boltzmann equation, direct statistical computation, simulated particles distribution function, semiconductor device hardware simulator, microdynamical transport, Boltzmann equation, binary format, drift velocity, static uniform electric field, hot carrier effects, computational complexity, Monte Carlo method
38	Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen, Kuo-Ming Wu, C. M. Liu	Effect of NDD dosage on hot-carrier reliability in DMOS transistors.	ISQED	2009	DBLP DOI BibTeX RDF
32	Chenyue Ma, Bo Li, Lining Zhang, Jin He 0003, Xing Zhang 0002, Xinnan Lin, Mansun Chan	A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability.	ISQED	2009	DBLP DOI BibTeX RDF
32	Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun	Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability.	ISQED	2007	DBLP DOI BibTeX RDF
32	Medhat Karam, Wael Fikry, Hisham Haddara, Hani F. Ragai	Implementation of hot-carrier reliability simulation in Eldo.	ISCAS (5)	2001	DBLP DOI BibTeX RDF
29	Sameer R. Herlekar, Hsiao-Chun Wu, Ashok Srivastava	Sensitivity of single-carrier QAM systems to phase noise arising from the hot-carrier effect.	WCNC	2006	DBLP DOI BibTeX RDF
20	Jae Seung Woo, Jang Woo Lee, Woo Young Choi	Quantitative Hot Carrier Injection Analysis of N-Type Tunnel Field-Effect Transistors.	IEEE Access	2023	DBLP DOI BibTeX RDF
20	Alexandros Dimopoulos, Mihai Sima, Stephen W. Neville	Leveraging Public Information to Fit a Compact Hot Carrier Injection Model to a Target Technology.	IEEE Access	2023	DBLP DOI BibTeX RDF
20	Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Joey Chiao-Yi Huang, Chin-Hao Chang	Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.	Sensors	2023	DBLP DOI BibTeX RDF
20	Mathieu Sicre, David Roy 0001, Françis Calmon	Hot-Carrier Degradation modeling of DCR drift in SPADs.	ESSDERC	2023	DBLP DOI BibTeX RDF
20	Xinyi Zhang, Kewei Wang, Fang Wang, Jiangjiang Li, Zhicheng Wu, Duoli Li, Bo Li, Jianhui Bu, Zhengsheng Han	Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET.	IRPS	2023	DBLP DOI BibTeX RDF
20	Rachael J. Parker, Jyothi Bhaskarr Velamala, Kuan-Yueh James Shen, David Johnston, Yao-Feng Chang, Stephen M. Ramey, Siang-jhih Sean Wu, Padma Penmatsa	A Physical Unclonable Function Leveraging Hot Carrier Injection Aging.	IRPS	2023	DBLP DOI BibTeX RDF
20	Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken	Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper.	IRPS	2023	DBLP DOI BibTeX RDF
20	Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang	Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.	IRPS	2023	DBLP DOI BibTeX RDF
20	Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan	Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET.	IRPS	2023	DBLP DOI BibTeX RDF
20	Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan 0002	The Correct Hot Carrier Degradation Model.	IRPS	2023	DBLP DOI BibTeX RDF
20	Vladislav A. Vashchenko, H. Sarbishaei	Voltage Acceleration of Power NLDMOS Hot Carrier Degradation.	IRPS	2023	DBLP DOI BibTeX RDF
20	Ricardo Ascázubi, Bahar Ajdari, Curtis Shirota	Accelerated Hot-Carrier Aging Based on Ultrafast Laser for CMOS Technologies.	LASCAS	2023	DBLP DOI BibTeX RDF
20	Xinze Li, Yuxuan Wu, Qiao Teng, Ying Sun, Xiao Gong, Guillaume Besnard, Christophe Maleville, Olivier Weber, Rui Zhang, Bing Chen, Dawei Gao, Ran Cheng	Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress.	ICICDT	2023	DBLP DOI BibTeX RDF
20	Anchal Thakur, Rohit Dhiman	A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement.	Microelectron. J.	2022	DBLP DOI BibTeX RDF
20	Da Wang, Yong Liu, Pengpeng Ren, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang	Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.	IRPS	2022	DBLP DOI BibTeX RDF
20	M. Hauser, P. Srinivasan 0002, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min	Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability.	IRPS	2022	DBLP DOI BibTeX RDF
20	Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao	Universal Hot Carrier Degradation Model under DC and AC Stresses.	IRPS	2022	DBLP DOI BibTeX RDF
20	Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros	Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications.	IRPS	2022	DBLP DOI BibTeX RDF
20	Bikram Kishore Mahajan, Yen-Pu Chen, Ulisses Alberto Heredia Rivera, Rahim Rahimi, Muhammad Ashraful Alam	Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
20	Stanislav Tyaginov, Aryan Afzalian, Alexander Makarov, Alexander Grill, Michiel Vandemaele, Maksim Cherenev, Mikhail I. Vexler, Geert Hellings, Ben Kaczer	On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
20	Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert Eneman, Ben Kaczer	Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
20	Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Erik Bury, Adrian Vaisman Chasin, Jacopo Franco, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken	Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.	IRPS	2022	DBLP DOI BibTeX RDF
20	Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy	A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
20	Jyothi Bhaskarr Velamala, Siang-jhih Sean Wu, Padma Penmatsa, Kuan-Yueh James Shen, David Johnston, Rachael J. Parker	PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology.	CICC	2022	DBLP DOI BibTeX RDF
20	Shida Zhang, Nael Mizanur Rahman, Venkata Chaitanya Krishna Chekuri, Carlos Tokunaga, Saibal Mukhopadhyay	Analysis of the Effect of Hot Carrier Injection in An Integrated Inductive Voltage Regulator.	ISLPED	2022	DBLP DOI BibTeX RDF
20	Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara	A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement.	IEEE J. Solid State Circuits	2021	DBLP DOI BibTeX RDF
20	C. Mukherjee 0001, Marine Couret, Cristell Maneux, Didier Céli	Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology.	ESSDERC	2021	DBLP DOI BibTeX RDF
20	Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam	Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.	IRPS	2021	DBLP DOI BibTeX RDF
20	Satyam Kumar 0003, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra	Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.	IRPS	2021	DBLP DOI BibTeX RDF
20	Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae	Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.	IRPS	2021	DBLP DOI BibTeX RDF
20	Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel	Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection.	IRPS	2021	DBLP DOI BibTeX RDF
20	Yang Xiang, Stanislav Tyaginov, Michiel Vandemaele, Zhicheng Wu, Jacopo Franco, Erik Bury, Brecht Truijen, Bertrand Parvais, Dimitri Linten, Ben Kaczer	A BSIM-Based Predictive Hot-Carrier Aging Compact Model.	IRPS	2021	DBLP DOI BibTeX RDF
20	Faxian Shan, Yang Xiong, Chang-Ching Chen, Haibo Chen, James Cho, Xiong Li, Wenyong Jiang, Jengwei Huang	Anomalous NMOSFET hot carrier degradation on DRAM.	ICTA	2021	DBLP DOI BibTeX RDF
20	Yijun Qian, Yuan Gao, Amit Kumar Shukla, Tao Wu, Xing Wei, Kai Lu, Yumeng Yang	Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in PDSOI nMOSFET.	ICTA	2021	DBLP DOI BibTeX RDF
20	Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam W. DiVergilio, Vibhor Jain, John J. Pekarik	Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs.	BCICTS	2021	DBLP DOI BibTeX RDF
20	Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara	36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In.	ISSCC	2021	DBLP DOI BibTeX RDF
20	Dharmaray Nedalgi, Saroja V. Siddamal	$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability.	APCCAS	2021	DBLP DOI BibTeX RDF
20	Xin Ju, Diing Shenp Ang	Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel Hot-Carrier Effect in the Metal-Oxide-Semiconductor Field-Effect Transistor.	IEEE Access	2020	DBLP DOI BibTeX RDF
20	Hossein Eslahi, Sayed Ali Albahrani, Dhawal Mahajan, Sourabh Khandelwal	An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
20	Hichem Ferhati, Fayçal Djeffal, Toufik Bentrcia	Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects.	ICM	2020	DBLP DOI BibTeX RDF
20	Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra	Hot Carrier Degradation in Cryo-CMOS.	IRPS	2020	DBLP DOI BibTeX RDF
20	Adrian Vaisman Chasin, Jacopo Franco, Erik Bury, Romain Ritzenthaler, Eugenio Dentoni Litta, Alessio Spessot, Naoto Horiguchi, Dimitri Linten, Ben Kaczer	Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation.	IRPS	2020	DBLP DOI BibTeX RDF
20	Maurits J. de Jong, Cora Salm, Jurriaan Schmitz	Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices.	IRPS	2020	DBLP DOI BibTeX RDF
20	Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele, Tibor Grasser, Geert Hellings, Alexander Makarov, Markus Jech, Dimitri Linten, Ben Kaczer	A Compact Physics Analytical Model for Hot-Carrier Degradation.	IRPS	2020	DBLP DOI BibTeX RDF
20	Hyeong-Sub Song, Sunil Babu Eadi, Hyun-Dong Song, Hyun-Woong Choi, Ga-Won Lee 0001, Hi-Deok Lee	Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging.	IRPS	2020	DBLP DOI BibTeX RDF
20	Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao	In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation.	IRPS	2020	DBLP DOI BibTeX RDF
20	Bernhard Ruch, Gregor Pobegen, Christian Schleich, Tibor Grasser	Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping.	IRPS	2020	DBLP DOI BibTeX RDF
20	Wataru Mizubayashi, Hiroshi Oka, Koichi Fukuda, Yuki Ishikawa, Kazuhiko Endo	Analysis of charge-to-hot-carrier degradation in Ge pFinFETs.	IRPS	2020	DBLP DOI BibTeX RDF
20	Michiel Vandemaele, Kai-Hsin Chuang, Erik Bury, Stanislav Tyaginov, Guido Groeseneken, Ben Kaczer	The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation.	IRPS	2020	DBLP DOI BibTeX RDF
20	Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho	Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS.	IRPS	2020	DBLP DOI BibTeX RDF
20	Uppili S. Raghunathan, Pui Yee, Dave Brochu, Vibhor Jain, Harrison P. Lee, John D. Cressler, Dimitris P. Ioannou	Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs.	BCICTS	2020	DBLP DOI BibTeX RDF
20	Kunyang Liu, Hongliang Pu, Hirofumi Shinohara	A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in.	CICC	2020	DBLP DOI BibTeX RDF
20	Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser	Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.	ESSDERC	2019	DBLP DOI BibTeX RDF
20	Marine Couret, Gerhard Fischer, Iria Garcia-Lopez, Magali De Matos, François Marc, Cristell Maneux	Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current.	ESSDERC	2019	DBLP DOI BibTeX RDF
20	Je-Joong Woo, Jong-Moon Choi, Kee-Won Kwon	CMOS-Compatible Learning Device for Neuromorphic Synapse Application using Adjustable Hot Carrier Injections.	MWSCAS	2019	DBLP DOI BibTeX RDF
20	Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok	Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.	IRPS	2019	DBLP DOI BibTeX RDF
20	M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan 0002, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam	Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.	IRPS	2019	DBLP DOI BibTeX RDF
20	Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Zlatan Stanojevic, Alexander Makarov, Adrian Vaisman Chasin, Erik Bury, Hans Mertens, Dimitri Linten, Guido Groeseneken	Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.	IRPS	2019	DBLP DOI BibTeX RDF
20	Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov	Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.	IRPS	2019	DBLP DOI BibTeX RDF
20	Matteo Pizzotti, Marco Crescentini, Andrea Natale Tallarico, Aldo Romani	An Integrated DC/DC Converter with Online Monitoring of Hot-Carrier Degradation.	ICECS	2019	DBLP DOI BibTeX RDF
20	Maurits J. de Jong, Cora Salm, Jurriaan Schmitz	Towards understanding recovery of hot-carrier induced degradation.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
20	Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava	Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability.	IRPS	2018	DBLP DOI BibTeX RDF
20	Dimitris P. Ioannou, Y. Tan, R. Logan, K. Bandy, R. Achanta, P. C. Wang, Dave Brochu, M. Jaffe	Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs.	IRPS	2018	DBLP DOI BibTeX RDF
20	Roberta Bottini, Andrea Ghetti, Sara Vigano, Maria Grazia Valentini, Pratap Murali, Chandra Mouli	Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs.	IRPS	2018	DBLP DOI BibTeX RDF
20	Guido T. Sasse	Hot carrier induced TDDB in HV MOS: Lifetime model and extrapolation to use conditions.	IRPS	2018	DBLP DOI BibTeX RDF
20	Yoko Yoshimura, Kensuke Ota, Masumi Saitoh	Hot carrier degradation, TDDB, and 1/f noise in Poly-Si Tri-gate nanowire transistor.	IRPS	2018	DBLP DOI BibTeX RDF
20	Minru Hao, Huiyong Hu, Chen-Guang Liao, Bin Wang, Haiyan Kang, He-Ming Zhang	Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
20	Rainer Duschl, Armin H. Fischer, Achim Gratz, Robert Wiesner	Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
20	Maurits J. de Jong, Cora Salm, Jurriaan Schmitz	Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
20	Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou	Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
20	Andrea Natale Tallarico, Susanna Reggiani, Paolo Magnone, Giuseppe Croce, Riccardo Depetro, P. Gattari, Enrico Sangiorgi, Claudio Fiegna	Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
20	Josip Zilak, Marko Koricic, Tomislav Suligoj	Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT).	MIPRO	2017	DBLP DOI BibTeX RDF
20	Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert	Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism.	IECON	2017	DBLP DOI BibTeX RDF
20	Miaomiao Wang 0006, Xin Miao, James H. Stathis, Richard G. Southwick	Hot carrier reliability in ultra-scaled sige channel p-FinFETs.	ASICON	2017	DBLP DOI BibTeX RDF
20	Jifa Hao	Hot carrier reliability in LDMOS devices.	ASICON	2017	DBLP DOI BibTeX RDF
20	Jianfu Zhang 0001, Meng Duan, Zhigang Ji, Weidong Zhang 0002	Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage.	ASICON	2017	DBLP DOI BibTeX RDF
20	Chang-Chih Chen, Taizhi Liu, Linda Milor	System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection.	IEEE Trans. Very Large Scale Integr. Syst.	2016	DBLP DOI BibTeX RDF
20	Mehdi Kamal, Qing Xie 0001, Massoud Pedram, Ali Afzali-Kusha, Saeed Safari	An efficient temperature dependent hot carrier injection reliability simulation flow.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
20	Alain Bravaix, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Vincent Huard	Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
20	Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis 0001, Gérard Ghibaudo, C. A. Dimitriadis	Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
20	Wenqi Zhang, Tzuo-Li Wang, Yan-hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yiying Li, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh, Yilin Yang	Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
20	Weichun Luo, Hong Yang, Wenwu Wang 0006, Yefeng Xu, Bo Tang, Shangqing Ren, Hao Xu, Yanrong Wang, Luwei Qi, Jiang Yan, Huilong Zhu, Chao Zhao, Dapeng Chen, Tianchun Ye 0001	Accurate lifetime prediction for channel hot carrier stress on sub-1 nm equivalent oxide thickness HK/MG nMOSFET with thin titanium nitride capping layer.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
20	Prateek Sharma, Stanislav Tyaginov, Stewart E. Rauch, Jacopo Franco, Ben Kaczer, Alexander Makarov, Mikhail I. Vexler, Tibor Grasser	A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs.	ESSDERC	2016	DBLP DOI BibTeX RDF
20	Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor	SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection.	ICCD	2016	DBLP DOI BibTeX RDF