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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 25 occurrences of 22 keywords
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Results
Found 280 publication records. Showing 280 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
88 | Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami |
GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA, pp. 73-80, 2000, IEEE Computer Society, 0-7695-0525-2. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Hot Carrier Effect, Gate level modeling, Gate level simulation, Circuit reliability simulation, VLSI |
76 | Xiangdong Xuan, Abhijit Chatterjee |
Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 323-328, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
hot-carrier, hierarchical analysis, hot-spot, performance degradation, Electromigration |
70 | Yang Liu, Ashok Kumar Srivastava, Yao Xu |
A switchable PLL frequency synthesizer and hot carrier effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 481-486, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
cmos phase-locked loop, hot carrier effects, jitter, voltage-controlled oscillator, phase noise |
70 | Yusuf Leblebici, Sung-Mo Kang |
Modeling of nMOS transistors for simulation of hot-carrier-induced device and circuit degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(2), pp. 235-246, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
63 | Wei Li, Qiang Li 0039, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates |
Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA, pp. 284-289, 2001, IEEE Computer Society, 0-7695-1025-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
56 | P. Srinivasan 0002, B. Vootukuru, Durga Misra |
Screening of Hot Electron Effect During Plasma Processing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 291-, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
45 | Ping-Chung Li, Ibrahim N. Hajj |
Computer-aided redesign of VLSI circuits for hot-carrier reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(5), pp. 453-464, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
45 | Ping-Chung Li, Georgios I. Stamoulis, Ibrahim N. Hajj |
A probabilistic timing approach to hot-carrier effect estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(10), pp. 1223-1234, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
44 | Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider |
Practical aspects of reliability analysis for IC designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 193-198, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
ESD, TDDB of intermetal dielectric, design-in reliability, gate oxide integrity, hot carrier stress, stress-induced voiding, NBTI, electromigration |
44 | Suresh Srinivasan, Prasanth Mangalagiri, Yuan Xie 0001, Narayanan Vijaykrishnan, Karthik Sarpatwari |
FLAW: FPGA lifetime awareness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 630-635, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
hot carrier effects, time dependent dielecric breakdown, FPGA, electromigration |
44 | Andy Negoi, Alain Guyot, Jacques Zimmermann |
A dedicated circuit for charged particles simulation using the Monte Carlo method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASAP ![In: 1997 International Conference on Application-Specific Systems, Architectures, and Processors (ASAP '97), 14-16 July 1997, Zurich, Switzerland, pp. 422-431, 1997, IEEE Computer Society, 0-8186-7958-1. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
dedicated circuit, charged particles simulation, dedicated integrated circuit, integro-differential Boltzmann equation, direct statistical computation, simulated particles distribution function, semiconductor device hardware simulator, microdynamical transport, Boltzmann equation, binary format, drift velocity, static uniform electric field, hot carrier effects, computational complexity, Monte Carlo method |
38 | Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen, Kuo-Ming Wu, C. M. Liu |
Effect of NDD dosage on hot-carrier reliability in DMOS transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 226-229, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
32 | Chenyue Ma, Bo Li, Lining Zhang, Jin He 0003, Xing Zhang 0002, Xinnan Lin, Mansun Chan |
A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 7-12, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
32 | Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun |
Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 53-58, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Medhat Karam, Wael Fikry, Hisham Haddara, Hani F. Ragai |
Implementation of hot-carrier reliability simulation in Eldo. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (5) ![In: Proceedings of the 2001 International Symposium on Circuits and Systems, ISCAS 2001, Sydney, Australia, May 6-9, 2001, pp. 515-518, 2001, IEEE, 0-7803-6685-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
29 | Sameer R. Herlekar, Hsiao-Chun Wu, Ashok Srivastava |
Sensitivity of single-carrier QAM systems to phase noise arising from the hot-carrier effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WCNC ![In: IEEE Wireless Communications and Networking Conference, WCNC 2006, 3-6 April 2006, Las Vegas, Nevada, USA, pp. 2121-2126, 2006, IEEE, 1-4244-0269-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
20 | Jae Seung Woo, Jang Woo Lee, Woo Young Choi |
Quantitative Hot Carrier Injection Analysis of N-Type Tunnel Field-Effect Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 14943-14950, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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20 | Alexandros Dimopoulos, Mihai Sima, Stephen W. Neville |
Leveraging Public Information to Fit a Compact Hot Carrier Injection Model to a Target Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 21417-21426, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Joey Chiao-Yi Huang, Chin-Hao Chang |
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(18), pp. 7959, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Mathieu Sicre, David Roy 0001, Françis Calmon |
Hot-Carrier Degradation modeling of DCR drift in SPADs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023, pp. 61-64, 2023, IEEE, 979-8-3503-0423-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Xinyi Zhang, Kewei Wang, Fang Wang, Jiangjiang Li, Zhicheng Wu, Duoli Li, Bo Li, Jianhui Bu, Zhengsheng Han |
Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-5, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Rachael J. Parker, Jyothi Bhaskarr Velamala, Kuan-Yueh James Shen, David Johnston, Yao-Feng Chang, Stephen M. Ramey, Siang-jhih Sean Wu, Padma Penmatsa |
A Physical Unclonable Function Leveraging Hot Carrier Injection Aging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-5, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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20 | Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken |
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-10, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang |
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-6, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan |
Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-6, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan 0002 |
The Correct Hot Carrier Degradation Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-5, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Vladislav A. Vashchenko, H. Sarbishaei |
Voltage Acceleration of Power NLDMOS Hot Carrier Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-4, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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20 | Ricardo Ascázubi, Bahar Ajdari, Curtis Shirota |
Accelerated Hot-Carrier Aging Based on Ultrafast Laser for CMOS Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LASCAS ![In: 14th IEEE Latin America Symposium on Circuits and System, LASCAS 2023, Quito, Ecuador, February 28 - March 3, 2023, pp. 1-3, 2023, IEEE, 978-1-6654-5705-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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20 | Xinze Li, Yuxuan Wu, Qiao Teng, Ying Sun, Xiao Gong, Guillaume Besnard, Christophe Maleville, Olivier Weber, Rui Zhang, Bing Chen, Dawei Gao, Ran Cheng |
Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023, pp. 116-119, 2023, IEEE, 979-8-3503-1931-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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20 | Anchal Thakur, Rohit Dhiman |
A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 126, pp. 105501, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
20 | Da Wang, Yong Liu, Pengpeng Ren, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang |
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 7, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | M. Hauser, P. Srinivasan 0002, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min |
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 5, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao |
Universal Hot Carrier Degradation Model under DC and AC Stresses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 7, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros |
Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 4, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Bikram Kishore Mahajan, Yen-Pu Chen, Ulisses Alberto Heredia Rivera, Rahim Rahimi, Muhammad Ashraful Alam |
Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 52-1, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Stanislav Tyaginov, Aryan Afzalian, Alexander Makarov, Alexander Grill, Michiel Vandemaele, Maksim Cherenev, Mikhail I. Vexler, Geert Hellings, Ben Kaczer |
On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 11, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert Eneman, Ben Kaczer |
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 6, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Erik Bury, Adrian Vaisman Chasin, Jacopo Franco, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken |
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 6, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy |
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 10, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Jyothi Bhaskarr Velamala, Siang-jhih Sean Wu, Padma Penmatsa, Kuan-Yueh James Shen, David Johnston, Rachael J. Parker |
PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: IEEE Custom Integrated Circuits Conference, CICC 2022, Newport Beach, CA, USA, April 24-27, 2022, pp. 1-2, 2022, IEEE, 978-1-6654-0756-4. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Shida Zhang, Nael Mizanur Rahman, Venkata Chaitanya Krishna Chekuri, Carlos Tokunaga, Saibal Mukhopadhyay |
Analysis of the Effect of Hot Carrier Injection in An Integrated Inductive Voltage Regulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: ISLPED '22: ACM/IEEE International Symposium on Low Power Electronics and Design, Boston, MA, USA, August 1 - 3, 2022, pp. 12:1-12:6, 2022, ACM, 978-1-4503-9354-6. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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20 | Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara |
A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 56(7), pp. 2193-2204, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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20 | C. Mukherjee 0001, Marine Couret, Cristell Maneux, Didier Céli |
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021, pp. 251-254, 2021, IEEE, 978-1-6654-3748-6. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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20 | Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam |
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-6, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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20 | Satyam Kumar 0003, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra |
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-5, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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20 | Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae |
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-4, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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20 | Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel |
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-4, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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20 | Yang Xiang, Stanislav Tyaginov, Michiel Vandemaele, Zhicheng Wu, Jacopo Franco, Erik Bury, Brecht Truijen, Bertrand Parvais, Dimitri Linten, Ben Kaczer |
A BSIM-Based Predictive Hot-Carrier Aging Compact Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-9, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Faxian Shan, Yang Xiong, Chang-Ching Chen, Haibo Chen, James Cho, Xiong Li, Wenyong Jiang, Jengwei Huang |
Anomalous NMOSFET hot carrier degradation on DRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICTA ![In: 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2021, Zhuhai, China, November 24-26, 2021, pp. 56-57, 2021, IEEE, 978-1-6654-1745-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Yijun Qian, Yuan Gao, Amit Kumar Shukla, Tao Wu, Xing Wei, Kai Lu, Yumeng Yang |
Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in PDSOI nMOSFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICTA ![In: 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2021, Zhuhai, China, November 24-26, 2021, pp. 239-240, 2021, IEEE, 978-1-6654-1745-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam W. DiVergilio, Vibhor Jain, John J. Pekarik |
Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BCICTS ![In: IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-3990-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara |
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021, pp. 502-504, 2021, IEEE, 978-1-7281-9549-0. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Dharmaray Nedalgi, Saroja V. Siddamal |
$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS ![In: IEEE Asia Pacific Conference on Circuit and Systems, APCCAS 2021, Penang, Malaysia, November 22-26, 2021, pp. 97-100, 2021, IEEE, 978-1-6654-3916-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Xin Ju, Diing Shenp Ang |
Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel Hot-Carrier Effect in the Metal-Oxide-Semiconductor Field-Effect Transistor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 14048-14053, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Hossein Eslahi, Sayed Ali Albahrani, Dhawal Mahajan, Sourabh Khandelwal |
An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10), pp. 2000-2005, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Hichem Ferhati, Fayçal Djeffal, Toufik Bentrcia |
Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICM ![In: 32nd International Conference on Microelectronics, ICM 2020, Aqaba, Jordan, December 14-17, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9664-0. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra |
Hot Carrier Degradation in Cryo-CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Adrian Vaisman Chasin, Jacopo Franco, Erik Bury, Romain Ritzenthaler, Eugenio Dentoni Litta, Alessio Spessot, Naoto Horiguchi, Dimitri Linten, Ben Kaczer |
Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Maurits J. de Jong, Cora Salm, Jurriaan Schmitz |
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele, Tibor Grasser, Geert Hellings, Alexander Makarov, Markus Jech, Dimitri Linten, Ben Kaczer |
A Compact Physics Analytical Model for Hot-Carrier Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-7, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Hyeong-Sub Song, Sunil Babu Eadi, Hyun-Dong Song, Hyun-Woong Choi, Ga-Won Lee 0001, Hi-Deok Lee |
Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao |
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Bernhard Ruch, Gregor Pobegen, Christian Schleich, Tibor Grasser |
Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Wataru Mizubayashi, Hiroshi Oka, Koichi Fukuda, Yuki Ishikawa, Kazuhiko Endo |
Analysis of charge-to-hot-carrier degradation in Ge pFinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Michiel Vandemaele, Kai-Hsin Chuang, Erik Bury, Stanislav Tyaginov, Guido Groeseneken, Ben Kaczer |
The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-7, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho |
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-8, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Uppili S. Raghunathan, Pui Yee, Dave Brochu, Vibhor Jain, Harrison P. Lee, John D. Cressler, Dimitris P. Ioannou |
Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BCICTS ![In: IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2020, Monterey, CA, USA, November 16-19, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9749-4. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Kunyang Liu, Hongliang Pu, Hirofumi Shinohara |
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: 2020 IEEE Custom Integrated Circuits Conference, CICC 2020, Boston, MA, USA, March 22-25, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-6031-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser |
Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019, pp. 262-265, 2019, IEEE, 978-1-7281-1539-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Marine Couret, Gerhard Fischer, Iria Garcia-Lopez, Magali De Matos, François Marc, Cristell Maneux |
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019, pp. 154-157, 2019, IEEE, 978-1-7281-1539-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Je-Joong Woo, Jong-Moon Choi, Kee-Won Kwon |
CMOS-Compatible Learning Device for Neuromorphic Synapse Application using Adjustable Hot Carrier Injections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MWSCAS ![In: 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019, pp. 57-60, 2019, IEEE, 978-1-7281-2788-0. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok |
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, pp. 1-4, 2019, IEEE, 978-1-5386-9504-3. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan 0002, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam |
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, pp. 1-6, 2019, IEEE, 978-1-5386-9504-3. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Zlatan Stanojevic, Alexander Makarov, Adrian Vaisman Chasin, Erik Bury, Hans Mertens, Dimitri Linten, Guido Groeseneken |
Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, pp. 1-7, 2019, IEEE, 978-1-5386-9504-3. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov |
Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, pp. 1-7, 2019, IEEE, 978-1-5386-9504-3. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Matteo Pizzotti, Marco Crescentini, Andrea Natale Tallarico, Aldo Romani |
An Integrated DC/DC Converter with Online Monitoring of Hot-Carrier Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECS ![In: 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019, pp. 562-565, 2019, IEEE, 978-1-7281-0996-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
20 | Maurits J. de Jong, Cora Salm, Jurriaan Schmitz |
Towards understanding recovery of hot-carrier induced degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 88-90, pp. 147-151, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava |
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 3, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Dimitris P. Ioannou, Y. Tan, R. Logan, K. Bandy, R. Achanta, P. C. Wang, Dave Brochu, M. Jaffe |
Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 2-1, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Roberta Bottini, Andrea Ghetti, Sara Vigano, Maria Grazia Valentini, Pratap Murali, Chandra Mouli |
Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 6, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Guido T. Sasse |
Hot carrier induced TDDB in HV MOS: Lifetime model and extrapolation to use conditions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 3-1, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Yoko Yoshimura, Kensuke Ota, Masumi Saitoh |
Hot carrier degradation, TDDB, and 1/f noise in Poly-Si Tri-gate nanowire transistor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 5, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Minru Hao, Huiyong Hu, Chen-Guang Liao, Bin Wang, Haiyan Kang, He-Ming Zhang |
Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 75, pp. 69-76, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Rainer Duschl, Armin H. Fischer, Achim Gratz, Robert Wiesner |
Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 76-77, pp. 149-153, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Maurits J. de Jong, Cora Salm, Jurriaan Schmitz |
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 76-77, pp. 136-140, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou |
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 74, pp. 74-80, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Andrea Natale Tallarico, Susanna Reggiani, Paolo Magnone, Giuseppe Croce, Riccardo Depetro, P. Gattari, Enrico Sangiorgi, Claudio Fiegna |
Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 76-77, pp. 475-479, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Josip Zilak, Marko Koricic, Tomislav Suligoj |
Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT). ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIPRO ![In: 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017, Opatija, Croatia, May 22-26, 2017, pp. 77-82, 2017, IEEE, 978-953-233-090-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert |
Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IECON ![In: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017, pp. 7969-7973, 2017, IEEE, 978-1-5386-1127-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Miaomiao Wang 0006, Xin Miao, James H. Stathis, Richard G. Southwick |
Hot carrier reliability in ultra-scaled sige channel p-FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017, pp. 666-669, 2017, IEEE, 978-1-5090-6625-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Jifa Hao |
Hot carrier reliability in LDMOS devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017, pp. 658-661, 2017, IEEE, 978-1-5090-6625-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Jianfu Zhang 0001, Meng Duan, Zhigang Ji, Weidong Zhang 0002 |
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017, pp. 670-673, 2017, IEEE, 978-1-5090-6625-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Chang-Chih Chen, Taizhi Liu, Linda Milor |
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 24(8), pp. 2712-2725, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Mehdi Kamal, Qing Xie 0001, Massoud Pedram, Ali Afzali-Kusha, Saeed Safari |
An efficient temperature dependent hot carrier injection reliability simulation flow. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 57, pp. 10-19, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Alain Bravaix, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Vincent Huard |
Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 64, pp. 163-167, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis 0001, Gérard Ghibaudo, C. A. Dimitriadis |
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 56, pp. 10-16, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Wenqi Zhang, Tzuo-Li Wang, Yan-hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yiying Li, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh, Yilin Yang |
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 67, pp. 89-93, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Weichun Luo, Hong Yang, Wenwu Wang 0006, Yefeng Xu, Bo Tang, Shangqing Ren, Hao Xu, Yanrong Wang, Luwei Qi, Jiang Yan, Huilong Zhu, Chao Zhao, Dapeng Chen, Tianchun Ye 0001 |
Accurate lifetime prediction for channel hot carrier stress on sub-1 nm equivalent oxide thickness HK/MG nMOSFET with thin titanium nitride capping layer. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 62, pp. 70-73, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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20 | Prateek Sharma, Stanislav Tyaginov, Stewart E. Rauch, Jacopo Franco, Ben Kaczer, Alexander Makarov, Mikhail I. Vexler, Tibor Grasser |
A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016, pp. 428-431, 2016, IEEE, 978-1-5090-2969-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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20 | Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor |
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 34th IEEE International Conference on Computer Design, ICCD 2016, Scottsdale, AZ, USA, October 2-5, 2016, pp. 225-232, 2016, IEEE Computer Society, 978-1-5090-5142-7. The full citation details ...](Pics/full.jpeg) |
2016 |
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